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Applied Optics

Applied Optics


  • Vol. 40, Iss. 28 — Oct. 1, 2001
  • pp: 4965–4970

Three-dimensional materials analysis by confocal Raman microspectroscopy

Lothar Kador, Tobias Schittkowski, Markus Bauer, and Yuwei Fan  »View Author Affiliations

Applied Optics, Vol. 40, Issue 28, pp. 4965-4970 (2001)

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Two- and three-dimensional spatial analysis of various composite materials was performed with a scanning confocal Raman microspectrometer. Samples include TiO2 microparticles, mixtures of polymers, and the surface of an older Eprom computer chip. In the last case both structural and compositional information was obtained by means of comparing the signal intensity of the Rayleigh line with that of the silicon Raman line at 520 cm-1. The spatial compositions of a pain-relief medicine and a pharmaceutical salt mixture could be visualized from characteristic Raman lines of the components.

© 2001 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(180.1790) Microscopy : Confocal microscopy
(300.6450) Spectroscopy : Spectroscopy, Raman

Original Manuscript: November 15, 2000
Revised Manuscript: May 2, 2001
Published: October 1, 2001

Lothar Kador, Tobias Schittkowski, Markus Bauer, and Yuwei Fan, "Three-dimensional materials analysis by confocal Raman microspectroscopy," Appl. Opt. 40, 4965-4970 (2001)

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