Three-dimensional materials analysis by confocal Raman microspectroscopy
Applied Optics, Vol. 40, Issue 28, pp. 4965-4970 (2001)
http://dx.doi.org/10.1364/AO.40.004965
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Abstract
Two- and three-dimensional spatial analysis of various composite materials was performed with a scanning confocal Raman microspectrometer. Samples include TiO2 microparticles, mixtures of polymers, and the surface of an older Eprom computer chip. In the last case both structural and compositional information was obtained by means of comparing the signal intensity of the Rayleigh line with that of the silicon Raman line at 520 cm−1. The spatial compositions of a pain-relief medicine and a pharmaceutical salt mixture could be visualized from characteristic Raman lines of the components.
© 2001 Optical Society of America
[Optical Society of America ]
OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(180.1790) Microscopy : Confocal microscopy
(300.6450) Spectroscopy : Spectroscopy, Raman
Citation
Lothar Kador, Tobias Schittkowski, Markus Bauer, and Yuwei Fan, "Three-dimensional materials analysis by confocal Raman microspectroscopy," Appl. Opt. 40, 4965-4970 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-28-4965
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