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Applied Optics

Applied Optics


  • Vol. 40, Iss. 28 — Oct. 1, 2001
  • pp: 4999–5010

Shifting of localization planes in optical testing: application to a shearing interferometer

Juan M. Simon, Silvia A. Comastri, and Rodolfo M. Echarri  »View Author Affiliations

Applied Optics, Vol. 40, Issue 28, pp. 4999-5010 (2001)

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An amplitude-division two-beam interferometer illuminated by a quasi-monochromatic, spatially incoherent, and periodic source yields multiple localization planes of interference fringes. If a thick transmission sample with a few localized phase disturbances in various layers is placed in the interferometer, the disturbances in a layer can be detected, making its images through the two arms coincide with a chosen localization plane. Different layers can be analyzed by means of shifting the localization plane by a variation of the source period without any other changes in the device. Here we illustrate this method by applying it to a shearing interferometer, a classical Wollaston prism placed between crossed polarizers. Experimental images of different observation planes are obtained, and they are in good agreement with the theoretical expectations.

© 2001 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry

Original Manuscript: November 1, 2000
Revised Manuscript: May 8, 2001
Published: October 1, 2001

Juan M. Simon, Silvia A. Comastri, and Rodolfo M. Echarri, "Shifting of localization planes in optical testing: application to a shearing interferometer," Appl. Opt. 40, 4999-5010 (2001)

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