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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 28 — Oct. 1, 2001
  • pp: 4999–5010

Shifting of localization planes in optical testing: application to a shearing interferometer

Juan M. Simon, Silvia A. Comastri, and Rodolfo M. Echarri  »View Author Affiliations


Applied Optics, Vol. 40, Issue 28, pp. 4999-5010 (2001)
http://dx.doi.org/10.1364/AO.40.004999


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Abstract

An amplitude-division two-beam interferometer illuminated by a quasi-monochromatic, spatially incoherent, and periodic source yields multiple localization planes of interference fringes. If a thick transmission sample with a few localized phase disturbances in various layers is placed in the interferometer, the disturbances in a layer can be detected, making its images through the two arms coincide with a chosen localization plane. Different layers can be analyzed by means of shifting the localization plane by a variation of the source period without any other changes in the device. Here we illustrate this method by applying it to a shearing interferometer, a classical Wollaston prism placed between crossed polarizers. Experimental images of different observation planes are obtained, and they are in good agreement with the theoretical expectations.

© 2001 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry

History
Original Manuscript: November 1, 2000
Revised Manuscript: May 8, 2001
Published: October 1, 2001

Citation
Juan M. Simon, Silvia A. Comastri, and Rodolfo M. Echarri, "Shifting of localization planes in optical testing: application to a shearing interferometer," Appl. Opt. 40, 4999-5010 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-28-4999


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References

  1. W. H. Steel, Interferometry (Cambridge University, London, 1967).
  2. P. Hariharan, B. F. Oreb, T. Eiju, “Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm,” Appl. Opt. 26, 2504–2506 (1987). [CrossRef] [PubMed]
  3. D. W. Phillion, “General methods for generating phase-shifting interferometry algorithms,” Appl. Opt. 36, 8098–8115 (1997). [CrossRef]
  4. D. Malacara, M. Servin, Z. Malacara, Interferogram Analysis for Optical Testing (Marcel Dekker, New York, 1998).
  5. B. V. Dorrio, J. L. Fernandez, “Phase-evaluation methods in whole-field optical measurement,” Meas. Sci. Technol. 10, 33–55 (1999). [CrossRef]
  6. J. M. Simon, S. A. Comastri, “Localization of interference fringes,” Am. J. Phys. 48, 665–668 (1980). [CrossRef]
  7. J. M. Simon, S. A. Comastri, “Fringe localization depth,” Appl. Opt. 26, 5125–5129 (1987). [CrossRef] [PubMed]
  8. J. M. Simon, S. A. Comastri, “Interferometers: equivalent sine condition,” Appl. Opt. 27, 4725–4730 (1988). [CrossRef] [PubMed]
  9. S. Cha, C. M. Vest, “Interferometry and reconstruction of strongly refracting asymmetric-refractive-index fields,” Opt. Lett. 4, 311–313 (1979). [CrossRef] [PubMed]
  10. J. Jahns, A. W. Lohmann, “The Lau effect (a diffraction experiment with incoherent illumination),” Opt. Commun. 28, 263–267 (1979). [CrossRef]
  11. J. M. Simon, M. C. Simon, R. M. Echarri, M. T. Garea, “Fringe localization in interferometers illuminated by a succession of incoherent line sources,” J. Mod. Opt. 45, 2245–2254 (1998). [CrossRef]
  12. S. A. Comastri, J. M. Simon, “Multilocalization and van Cittert–Zernike theorem. 1. Theory,” J. Opt. Soc. Am. 17, 1265–1276 (2000). [CrossRef]
  13. J. M. Simon, S. A. Comastri, “Multilocalization and van Cittert–Zernike theorem. 2. Application to the Wollaston prism,” J. Opt. Soc. Am. 17, 1277–1283 (2000). [CrossRef]
  14. J. M. Simon, S. A. Comastri, R. Echarri, “The Mach–Zehnder interferometer: examination of a volume by non-classical localization plane shifting,” Pure Appl. Opt. 3, 242–249 (2001).

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