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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 28 — Oct. 1, 2001
  • pp: 5040–5045

Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy

Gregor Schürmann, Wilfried Noell, Urs Staufer, Nico F. de Rooij, Rolf Eckert, Jan M. Freyland, and Harry Heinzelmann  »View Author Affiliations


Applied Optics, Vol. 40, Issue 28, pp. 5040-5045 (2001)
http://dx.doi.org/10.1364/AO.40.005040


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Abstract

A cantilever-based probe is introduced for use in scanning near-field optical microscopy (SNOM) combined with scanning atomic-force microscopy (AFM). The probes consist of silicon cantilevers with integrated 25-µm-high fused-silica tips. The probes are batch fabricated by microfabrication technology. Transmission electron microscopy reveals that the transparent quartz tips are completely covered with an opaque aluminum layer before the SNOM measurement. Static and dynamic AFM imaging was performed. SNOM imaging in transmission mode of single fluorescent molecules shows an optical resolution better than 32 nm.

© 2001 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(180.2520) Microscopy : Fluorescence microscopy
(180.5810) Microscopy : Scanning microscopy
(230.3990) Optical devices : Micro-optical devices

History
Original Manuscript: November 28, 2000
Revised Manuscript: May 24, 2001
Published: October 1, 2001

Citation
Gregor Schürmann, Wilfried Noell, Urs Staufer, Nico F. de Rooij, Rolf Eckert, Jan M. Freyland, and Harry Heinzelmann, "Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy," Appl. Opt. 40, 5040-5045 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-28-5040

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