OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 31 — Nov. 1, 2001
  • pp: 5583–5587

Diffraction from tunable periodic structures: application for the determination of electro-optic coefficients

Xi Yang, Lowell T. Wood, and John H. Miller, Jr.  »View Author Affiliations


Applied Optics, Vol. 40, Issue 31, pp. 5583-5587 (2001)
http://dx.doi.org/10.1364/AO.40.005583


View Full Text Article

Enhanced HTML    Acrobat PDF (255 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We discuss a method for measuring electro-optic coefficients by measuring diffraction from a tunable grating. The method involves measuring the changes in the diffraction pattern of a reflection grating, where applied electric fields of alternating direction induce changes in the index of refraction through the electro-optic effect. For certain geometries, these applied fields cause period-doubling effects that produce new peaks in the diffraction pattern. Numerically calculated diffraction patterns are presented for the assumptions of both homogeneous and inhomogeneous fields. Peak splitting, as a function of both the number of slits illuminated and the induced change in the index of refraction, is observed and discussed. Finally, the usefulness of our method for the measurement of electro-optic coefficients is discussed.

© 2001 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(050.1960) Diffraction and gratings : Diffraction theory
(160.2100) Materials : Electro-optical materials
(230.2090) Optical devices : Electro-optical devices

History
Original Manuscript: February 15, 2001
Revised Manuscript: May 25, 2001
Published: November 1, 2001

Citation
Xi Yang, Lowell T. Wood, and John H. Miller, "Diffraction from tunable periodic structures: application for the determination of electro-optic coefficients," Appl. Opt. 40, 5583-5587 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-31-5583


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. F. Wang, E. Furman, G. H. Haertling, “Electro-optic measurements of thin-film materials by means of reflection differential ellipsometry,” J. Appl. Phys. 78(1), 9–14 (1995).
  2. R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
  3. P. Rohl, B. Andress, J. Nordmann, “Electro-optic determination of second and third-order susceptibilities in poled polymer films,” Appl. Phys. Lett. 59, 2793–2795 (1991). [CrossRef]
  4. F. Wang, K. K. Li, V. Fuflyigin, H. Jiang, J. Zhao, P. Norris, “Thin ferroelectric interferometer for spatial light modulations,” Appl. Opt. 37, 7490–7495 (1998). [CrossRef]
  5. F. Wang, V. Fuflyigin, A. Osinsky, “Electro-optic properties of oxide ferroelectrics grown on GaN/sapphire,” J. Appl. Phys. 88, 1701–1703 (2000). [CrossRef]
  6. F. Wang, G. H. Haertling, “Birefringent bistability in (Pb,La)(Zr,Ti)O3 thin films with a ferroelectric-semiconductor interface,” Appl. Phys. Lett. 63, 1730–1733 (1993). [CrossRef]
  7. R. M. A. Azzam, “Ellipsometry,” in Handbook in Optics, M. Bass, ed. (McGraw-Hill, New York, 1995), Vol. 2, Chap. 27.
  8. D. Trivedi, P. Tayebati, M. Tabat, “Measurement of large electro-optic coefficients in thin films of strontium barium niobate (Sr0.6Ba0.4Nb2O6),” Appl. Phys. Lett. 68, 3227–3229 (1996). [CrossRef]
  9. P. Tayebati, D. Trivedi, M. Tabat, “Pulsed laser deposition of SBN:75 thin films with electro-optic coefficient of 844pm/V,” Appl. Phys. Lett. 69, 1023–1025 (1996). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited