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Applied Optics

Applied Optics


  • Vol. 40, Iss. 31 — Nov. 1, 2001
  • pp: 5718–5725

Modified needle method with simultaneous thickness and refractive-index refinement for the synthesis of inhomogeneous and multilayer optical thin films

Pierre G. Verly  »View Author Affiliations

Applied Optics, Vol. 40, Issue 31, pp. 5718-5725 (2001)

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Useful features of an efficient thin-film synthesis technique based on the refinement of inhomogeneous films are adapted to the needle method. As in the former approach, all the layer refractive indices and thicknesses are refined simultaneously, and special attention is given to computation speed and accuracy. In particular, key parameters are calculated from analytical formulas, namely, the gradients used in the optimization routines and the optimum needle positions and refractive indices. Inhomogeneous as well as multilayer solutions are possible. The efficiency of the modified approach is demonstrated by the solution of a complex nonpolarizing, wide-angle antireflection coating problem. The results are compared with those obtained in the past by the conventional needle method and by refinement of inhomogeneous films.

© 2001 Optical Society of America

OCIS Codes
(230.4170) Optical devices : Multilayers
(310.0310) Thin films : Thin films
(310.1210) Thin films : Antireflection coatings
(310.1620) Thin films : Interference coatings
(310.6860) Thin films : Thin films, optical properties

Original Manuscript: April 5, 2001
Revised Manuscript: June 8, 2001
Published: November 1, 2001

Pierre G. Verly, "Modified needle method with simultaneous thickness and refractive-index refinement for the synthesis of inhomogeneous and multilayer optical thin films," Appl. Opt. 40, 5718-5725 (2001)

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