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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 34 — Dec. 1, 2001
  • pp: 6229–6235

Model for excess noise in voltage-biased superconducting bolometers

Jan M. Gildemeister, Adrian T. Lee, and Paul L. Richards  »View Author Affiliations


Applied Optics, Vol. 40, Issue 34, pp. 6229-6235 (2001)
http://dx.doi.org/10.1364/AO.40.006229


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Abstract

We are developing superconducting transition-edge bolometers for far-infrared and millimeter wavelengths. The bolometers described here are suspended by thin legs of silicon nitride for thermal isolation. At frequencies between 200 mHz and 10–50 Hz these devices show white noise at their thermal fluctuation limit (NEP ≈ 10<sup>−17</sup> W/ √Hz). At higher frequencies a broad peak appears in the noise spectrum, which we attribute to a combination of thermal fluctuations in complex thermal circuits and electrothermal feedback. Detailed noise calculations fit the noise measured in three different devices that were specifically designed to test the model. We discuss how changes in bolometer materials can shift the noise peak above the frequency range of interest for most applications.

© 2001 Optical Society of America

OCIS Codes
(040.1240) Detectors : Arrays
(040.3060) Detectors : Infrared
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(160.1890) Materials : Detector materials
(220.3740) Optical design and fabrication : Lithography
(220.4000) Optical design and fabrication : Microstructure fabrication

Citation
Jan M. Gildemeister, Adrian T. Lee, and Paul L. Richards, "Model for excess noise in voltage-biased superconducting bolometers," Appl. Opt. 40, 6229-6235 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-34-6229


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References

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