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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 5 — Feb. 10, 2001
  • pp: 672–677

Precise Measurement of Thermal-Induced Refractive-Index Change in BaTiO3 on the Basis of Anisotropic Self-Diffraction

Bor Wang and Ching-Cherng Sun  »View Author Affiliations


Applied Optics, Vol. 40, Issue 5, pp. 672-677 (2001)
http://dx.doi.org/10.1364/AO.40.000672


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Abstract

We propose a method for precise measurement of the temperature-dependent refractive-index change in BaTiO<sub>3</sub> by use of anisotropic self-diffraction (ASD). In this method the refractive-index change corresponds to the angle deviation of the diffraction pattern. Because only the geometry of the ASD is used for measuring, the precision of measurement is independent of crystal thickness and environmental perturbation. The accuracy of the refractive-index change achieved is 10<sup>−4</sup> when the resolution of the measurement of the angle is ~0.04°. Both the theory and the experiment are demonstrated.

© 2001 Optical Society of America

OCIS Codes
(090.7330) Holography : Volume gratings
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(190.5330) Nonlinear optics : Photorefractive optics

Citation
Bor Wang and Ching-Cherng Sun, "Precise Measurement of Thermal-Induced Refractive-Index Change in BaTiO3 on the Basis of Anisotropic Self-Diffraction," Appl. Opt. 40, 672-677 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-5-672


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References

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