OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 6 — Feb. 20, 2001
  • pp: 913–915

Semiconductor line source for low-coherence interferometry

Andrei V. Zvyagin, Michael G. Garcia-Webb, and David D. Sampson  »View Author Affiliations


Applied Optics, Vol. 40, Issue 6, pp. 913-915 (2001)
http://dx.doi.org/10.1364/AO.40.000913


View Full Text Article

Enhanced HTML    Acrobat PDF (143 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

The suitability for low-coherence interferometry of a high-power, semiconductor laser line source operated at a forward bias current below threshold is demonstrated. Measurements of the important characteristics of the source are presented. For example, the source produces an output power of 1.3 mW and a spatially uniform coherence length of 16 µm at a bias current of 86% of threshold (250 mA) at 20 °C. The usefulness of the source is verified by measurement of the line profile of a contact lens.

© 2001 Optical Society of America

OCIS Codes
(110.1650) Imaging systems : Coherence imaging
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(140.2010) Lasers and laser optics : Diode laser arrays

History
Original Manuscript: January 3, 2000
Revised Manuscript: October 6, 2000
Published: February 20, 2001

Citation
Andrei V. Zvyagin, Michael G. Garcia-Webb, and David D. Sampson, "Semiconductor line source for low-coherence interferometry," Appl. Opt. 40, 913-915 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-6-913


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. T. R. Corle, G. S. Kino, Confocal Scanning Optical Microscopy and Related Imaging Systems (Academic, San Diego, Calif., 1996).
  2. P. de Grout, L. Deck, “Surface profiling by analysis of white-light interferograms in the spatial frequency domain,” J. Mod. Opt. 42, 389–401 (1995). [CrossRef]
  3. S. R. Chinn, E. A. Swanson, “Blindness limitation in optical coherence domain reflectometry,” Electron. Lett. 29, 2025–2027 (1993). [CrossRef]
  4. D. Botez, D. R. Scifres, Diode Laser Arrays (Cambridge University, Cambridge, England, 1994). [CrossRef]
  5. R. A. Griffin, D. A. Jackson, D. D. Sampson, “Coherence and noise properties of gain-switched Fabry–Perot semiconductor lasers,” IEEE J. Sel. Top. Quantum Electron. 1, 569–576 (1995). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1 Fig. 2 Fig. 3
 
Fig. 4
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited