Abstract

The method of cavity ringdown spectroscopy (when a tunable pulsed optical parametric oscillator was used) was extended for the loss evaluation in thin films (2–20-µm thickness). The technique was applied in two key telecommunication wavelength ranges of 1260–1330 and 1480–1650 nm. The measurement sensitivity was determined to be 50 ppm (5 × 10^-5). The results for polymer films are in close correlation with conventional spectrophotometric data and propagation loss for planar waveguides. Films of greater thickness and better optical quality are expected to provide an even higher loss resolution.

© 2001 Optical Society of America

Characterization of thin-film losses with a synchronously pumped ringdown cavity

Georgiy Vaschenko, Yogesh Godwal, Carmen S. Menoni, Claude Montcalm, Richard Blacker, and Daniel Siegfried
Appl. Opt. 42(22) 4584-4589 (2003)

Cavity ringdown spectroscopy of thin films in the mid-infrared

George A. Marcus and H. Alan Schwettman
Appl. Opt. 41(24) 5167-5171 (2002)

Cavity ringdown spectroscopic detection of nitric oxide with a continuous-wave quantum-cascade laser

Anatoliy A. Kosterev, Alexander L. Malinovsky, Frank K. Tittel, Claire Gmachl, Federico Capasso, Deborah L. Sivco, James N. Baillargeon, Albert L. Hutchinson, and Alfred Y. Cho
Appl. Opt. 40(30) 5522-5529 (2001)

Monolithic folded resonator for evanescent wave cavity ringdown spectroscopy

Andrew C. R. Pipino
Appl. Opt. 39(9) 1449-1453 (2000)

Monitoring adsorption and sedimentation using evanescent-wave cavity ringdown ellipsometry

Katerina Stamataki, Vassilis Papadakis, Michael A. Everest, Stelios Tzortzakis, Benoit Loppinet, and T. Peter Rakitzis
Appl. Opt. 52(5) 1086-1093 (2013)