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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 9 — Mar. 20, 2001
  • pp: 1570–1573

Cavity ringdown detection of losses in thin films in the telecommunication wavelength window

Stephan L. Logunov  »View Author Affiliations


Applied Optics, Vol. 40, Issue 9, pp. 1570-1573 (2001)
http://dx.doi.org/10.1364/AO.40.001570


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Abstract

The method of cavity ringdown spectroscopy (when a tunable pulsed optical parametric oscillator was used) was extended for the loss evaluation in thin films (2–20-µm thickness). The technique was applied in two key telecommunication wavelength ranges of 1260–1330 and 1480–1650 nm. The measurement sensitivity was determined to be 50 ppm (5 × 10-5). The results for polymer films are in close correlation with conventional spectrophotometric data and propagation loss for planar waveguides. Films of greater thickness and better optical quality are expected to provide an even higher loss resolution.

© 2001 Optical Society of America

OCIS Codes
(300.6490) Spectroscopy : Spectroscopy, surface
(310.6860) Thin films : Thin films, optical properties

History
Original Manuscript: June 28, 2000
Revised Manuscript: November 6, 2000
Published: March 20, 2001

Citation
Stephan L. Logunov, "Cavity ringdown detection of losses in thin films in the telecommunication wavelength window," Appl. Opt. 40, 1570-1573 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-9-1570

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