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Applied Optics

Applied Optics


  • Vol. 41, Iss. 1 — Jan. 1, 2002
  • pp: 125–129

Laser profiling system for on-line measurement of superfine surfaces

Zhao-Fei Zhou, Tao Zhang, and Wei-Dong Zhou  »View Author Affiliations

Applied Optics, Vol. 41, Issue 1, pp. 125-129 (2002)

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A profiling system for on-line and noncontact measurement of superfine surfaces is described. The system uses the principle of a differential interferometer with coaxial interference arms. The measuring head (optical part) of this system is separable and can be installed on machine tools or in existing measuring instruments. It has excellent resistance to vibration and air turbulence; therefore it needs no damper or cover. This system scans sample surfaces to measure a microprofile with a vertical resolution of 0.08 nm rms.

© 2002 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(220.4840) Optical design and fabrication : Testing

Original Manuscript: February 13, 2001
Revised Manuscript: July 20, 2001
Published: January 1, 2002

Zhao-Fei Zhou, Tao Zhang, and Wei-Dong Zhou, "Laser profiling system for on-line measurement of superfine surfaces," Appl. Opt. 41, 125-129 (2002)

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