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Applied Optics

Applied Optics


  • Vol. 41, Iss. 1 — Jan. 1, 2002
  • pp: 21–26

Measurement method for profiling the residual stress and the strain-optic coefficient of an optical fiber

Yongwoo Park, Tae-Jung Ahn, Yune Hyoun Kim, Won-Taek Han, Un-Chul Paek, and Dug Young Kim  »View Author Affiliations

Applied Optics, Vol. 41, Issue 1, pp. 21-26 (2002)

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A method, believed novel, is demonstrated for determining the strain-optic coefficient profile as well as the residual-stress profile of an optical fiber by use of a modified polariscope combined with a fiber-elongation apparatus. Measurement results of the residual-stress and the strain-optic coefficient profiles for Ge-doped and Er–Ge–Al-doped optical fibers are demonstrated with this method.

© 2002 Optical Society of America

OCIS Codes
(060.2270) Fiber optics and optical communications : Fiber characterization
(060.2280) Fiber optics and optical communications : Fiber design and fabrication
(060.2290) Fiber optics and optical communications : Fiber materials
(060.2300) Fiber optics and optical communications : Fiber measurements
(060.2400) Fiber optics and optical communications : Fiber properties

Original Manuscript: February 14, 2001
Revised Manuscript: August 9, 2001
Published: January 1, 2002

Yongwoo Park, Tae-Jung Ahn, Yune Hyoun Kim, Won-Taek Han, Un-Chul Paek, and Dug Young Kim, "Measurement method for profiling the residual stress and the strain-optic coefficient of an optical fiber," Appl. Opt. 41, 21-26 (2002)

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