A simplified theoretical model has been proposed to predict optical parameters such as thickness, thickness irregularity, refractive index, and extinction coefficient from transmission spectra. The proposed formula has been solved for thickness and thickness irregularity in the transparent region, and then the refractive index is calculated for the entire spectral region by use of the interference fringes order. The extinction coefficient is then calculated with the exact formula in the transparent region, and an appropriate model for the refractive index is used to solve for the extinction coefficient in the absorption region (where the interference fringes disappear). The proposed model is tested with the theoretical predicted data as well as experimental data. The calculation shows that the approximations used for solving a multiparameter nonlinear equation result in no significant errors.

© 2002 Optical Society of America

[Optical Society of America ]

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

Related Journal Articles

• Dip-Coated Thin-Film Polycarbonate Optical Waveguides (AO)
• Optical Coating Synthesis by Simultaneous Refractive-Index and Thickness Refinement of Inhomogeneous Films (AO)
• Interference Coatings Based on Synthesized Silicon Nitride (AO)
• Determination of the Refractive Indices of Layers in a Multilayer Stack by a Guided-Wave Technique (AO)
• Omnidirectional Mirror Design With Quarter-Wave Dielectric Stacks (AO)

Related Conference Papers

• Rare-Earth-Doped Yttria Waveguides Grown by Pulsed Laser Deposition
• En Route to Electrically Pumpable Cr2+ Doped II-VI Semiconductor Lasers
• Recording of polarization holograms in photodarkened amorphous As2S3 thin films
• Improved Fourier transform technique to determine second-order optical nonlinearity profiles
• Visualization of Ferroelectric Domains of Multiferroic BiFeO3 Thin Films Using Terahertz Radiation as a Sensitive Probe