Differential Interference Contrast Microscopy as a Polarimetric Instrument
Applied Optics, Vol. 41, Issue 1, pp. 38-45 (2002)
http://dx.doi.org/10.1364/AO.41.000038
Acrobat PDF (567 KB)
Abstract
Differential interference contrast (DIC) microscopy is shown to be equivalent to an incomplete Stokes polarimeter capable of probing optical properties of materials on microscopic-length scales. The Mueller matrix for a DIC microscope is calculated for various types of samples, and the polarimetric properties for DIC component parts of a spaceflight microscope are spectrally measured. As a practical application, a measurement of the index mismatch between colloidal particles and a nearly index-matched fluid bath was performed.
© 2002 Optical Society of America
[Optical Society of America ]
OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(180.0180) Microscopy : Microscopy
(230.5440) Optical devices : Polarization-selective devices
Citation
Andrew Resnick, "Differential Interference Contrast Microscopy as a Polarimetric Instrument," Appl. Opt. 41, 38-45 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-1-38
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Polarization state fixer composed of passive optical devices (JOSAA)
- Broadband, high spectral resolution 2-D wavelength-parallel polarimeter for Dense WDM systems (OE)
- Normal-incidence generalized ellipsometry using the two-modulator generalized ellipsometry microscope (AO)
- Parallel-slab polarizing beam splitter and photopolarimeter (AO)
- Time-domain method for characterizing retardation plates with high sensitivity and resolution (JOSAB)
Related Conference Papers
- Miniaturized Channeled Spectropolarimeter
- Fast wavelength-parallel polarization sensor for multi-wavelength optical networks
- Fresnel rhomb and other devices for handling and teaching polarization: inexpensive design
- Condition Number as a Metric for the Effectiveness of Polarimetric Algorithms
- Three-Dimensional Complete Polarization Sensitive Imaging Using a Confocal Mueller Matrix Imaging Polarimeter
« Previous Article | Next Article »
OSA is a member of 