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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 1 — Jan. 1, 2002
  • pp: 38–45

Differential interference contrast microscopy as a polarimetric instrument

Andrew Resnick  »View Author Affiliations


Applied Optics, Vol. 41, Issue 1, pp. 38-45 (2002)
http://dx.doi.org/10.1364/AO.41.000038


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Abstract

Differential interference contrast (DIC) microscopy is shown to be equivalent to an incomplete Stokes polarimeter capable of probing optical properties of materials on microscopic-length scales. The Mueller matrix for a DIC microscope is calculated for various types of samples, and the polarimetric properties for DIC component parts of a spaceflight microscope are spectrally measured. As a practical application, a measurement of the index mismatch between colloidal particles and a nearly index-matched fluid bath was performed.

© 2002 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(180.0180) Microscopy : Microscopy
(230.5440) Optical devices : Polarization-selective devices

History
Original Manuscript: June 25, 2001
Revised Manuscript: September 6, 2001
Published: January 1, 2002

Citation
Andrew Resnick, "Differential interference contrast microscopy as a polarimetric instrument," Appl. Opt. 41, 38-45 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-1-38

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