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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 1 — Jan. 1, 2002
  • pp: 80–87

Spatially modulated illumination microscopy allows axial distance resolution in the nanometer range

Benno Albrecht, Antonio Virgilio Failla, Andreas Schweitzer, and Christoph Cremer  »View Author Affiliations


Applied Optics, Vol. 41, Issue 1, pp. 80-87 (2002)
http://dx.doi.org/10.1364/AO.41.000080


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Abstract

For an improved understanding of the structural basis of cellular mechanisms, it is highly desirable to develop methods for a detailed topological analysis of biological nanostructures and their dynamics in the interior of three-dimensionally conserved cells. We present a method of far-field laser fluorescence microscopy to measure relative axial positions of pointlike fluorescent targets and the distance between each target in the range of a few nanometers. The physical principle behind this approach can be extended to the determination of three-dimensional (3D) positions and 3D distances between any number of objects that can be discriminated owing to their spectral signature, thus allowing topological measurements so far regarded to be beyond the capabilities of light microscopy.

© 2002 Optical Society of America

OCIS Codes
(100.6890) Image processing : Three-dimensional image processing
(140.3570) Lasers and laser optics : Lasers, single-mode
(170.2520) Medical optics and biotechnology : Fluorescence microscopy
(180.3170) Microscopy : Interference microscopy

History
Original Manuscript: February 12, 2001
Published: January 1, 2002

Citation
Benno Albrecht, Antonio Virgilio Failla, Andreas Schweitzer, and Christoph Cremer, "Spatially modulated illumination microscopy allows axial distance resolution in the nanometer range," Appl. Opt. 41, 80-87 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-1-80

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