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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 10 — Apr. 1, 2002
  • pp: 1977–1983

Application of fluorescence microscopy for noninvasive detection of surface contamination and precursors to laser-induced damage

Stavros G. Demos and Mike Staggs  »View Author Affiliations


Applied Optics, Vol. 41, Issue 10, pp. 1977-1983 (2002)
http://dx.doi.org/10.1364/AO.41.001977


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Abstract

We present an experimental investigation to evaluate fluorescence microscopy as a tool to detect surface contamination as well as reveal surface damage precursors on optical components for large-aperture laser systems. We performed fluorescence imaging experiments using 351-nm laser excitation, whereas in situ damage testing was performed at laser fluences well below the dielectric breakdown threshold of the pure material. The experimental results demonstrated the potential of this technique to address both aforementioned technical issues.

© 2002 Optical Society of America

OCIS Codes
(140.3330) Lasers and laser optics : Laser damage
(140.3380) Lasers and laser optics : Laser materials
(180.2520) Microscopy : Fluorescence microscopy

History
Original Manuscript: August 21, 2001
Revised Manuscript: November 27, 2001
Published: April 1, 2002

Citation
Stavros G. Demos and Mike Staggs, "Application of fluorescence microscopy for noninvasive detection of surface contamination and precursors to laser-induced damage," Appl. Opt. 41, 1977-1983 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-10-1977


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References

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