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Applied Optics

Applied Optics


  • Vol. 41, Iss. 10 — Apr. 1, 2002
  • pp: 2008–2014

Aspect ratio of elongated polychromatic far-field speckles of continuous and discrete spectral distribution with respect to surface roughness characterization

Peter Lehmann  »View Author Affiliations

Applied Optics, Vol. 41, Issue 10, pp. 2008-2014 (2002)

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Here polychromatic speckle patterns generated either by a polychromatic light source that emits at discrete frequencies or by a light source showing a continuous narrow-band spectral distribution are studied. The purpose here is the application of polychromatic speckle-pattern analysis to an in-process surface roughness characterization. To compare the coherence properties of the different polychromatic light sources, first a modified definition of the coherence length is introduced. Furthermore, the relevant optical phenomena, namely, the speckle elongation caused by the angular dispersion and the roughness-dependent speckle decorrelation, are summarized. It is shown that light sources with a continuous spectral distribution have essential advantages in comparison with discrete wavelength sources. The theoretical results are confirmed by experimental investigations based on a digital algorithm for the evaluation of CCD images of polychromatic speckle patterns, which are recorded in the Fourier plane of a Fourier-transforming lens.

© 2002 Optical Society of America

OCIS Codes
(030.0030) Coherence and statistical optics : Coherence and statistical optics
(030.5770) Coherence and statistical optics : Roughness
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

Original Manuscript: May 22, 2001
Revised Manuscript: October 5, 2001
Published: April 1, 2002

Peter Lehmann, "Aspect ratio of elongated polychromatic far-field speckles of continuous and discrete spectral distribution with respect to surface roughness characterization," Appl. Opt. 41, 2008-2014 (2002)

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