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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 10 — Apr. 1, 2002
  • pp: 2038–2042

Refractive-index profiling of embedded microstructures in optical materials

Digant P. Davé and Thomas E. Milner  »View Author Affiliations


Applied Optics, Vol. 41, Issue 10, pp. 2038-2042 (2002)
http://dx.doi.org/10.1364/AO.41.002038


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Abstract

We describe use of a phase-sensitive low-coherence reflectometer to measure spatial variation of refractive index in optical materials. The described interferometric technique is demonstrated to be a valuable tool to profile the refractive index of optical elements such as integrated waveguides and photowritten optical microstructures. As an example, a refractive-index profile is mapped of a microstructure written in a microscope glass slide with an ultrashort-pulse laser.

© 2002 Optical Society of America

OCIS Codes
(220.4000) Optical design and fabrication : Microstructure fabrication
(220.4840) Optical design and fabrication : Testing
(290.3030) Scattering : Index measurements
(320.7160) Ultrafast optics : Ultrafast technology

History
Original Manuscript: August 15, 2001
Revised Manuscript: November 5, 2001
Published: April 1, 2002

Citation
Digant P. Davé and Thomas E. Milner, "Refractive-index profiling of embedded microstructures in optical materials," Appl. Opt. 41, 2038-2042 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-10-2038

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