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Applied Optics

Applied Optics


  • Vol. 41, Iss. 13 — May. 1, 2002
  • pp: 2408–2413

Analysis of Seidel aberration by use of the discrete wavelet transform

Rong-Seng Chang, Jin-Yi Sheu, and Ching-Huang Lin  »View Author Affiliations

Applied Optics, Vol. 41, Issue 13, pp. 2408-2413 (2002)

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Seidel aberration coefficients can be expressed by Zernike coefficients. The least-squares matrix-inversion method of determining Zernike coefficients from a sampled wave front with measurement noise has been found to be numerically unstable. We present a method of estimating the Seidel aberration coefficients by using a two-dimensional discrete wavelet transform. This method is applied to analyze the wave front of an optical system, and we obtain not only more-accurate Seidel aberration coefficients, but we also speed the computation. Three simulated wave fronts are fitted, and simulation results are shown for spherical aberration, coma, astigmatism, and defocus.

© 2002 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(100.5070) Image processing : Phase retrieval
(100.7410) Image processing : Wavelets

Original Manuscript: November 14, 2001
Published: May 1, 2002

Rong-Seng Chang, Jin-Yi Sheu, and Ching-Huang Lin, "Analysis of Seidel aberration by use of the discrete wavelet transform," Appl. Opt. 41, 2408-2413 (2002)

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