## Analysis of Seidel aberration by use of the discrete wavelet transform

Applied Optics, Vol. 41, Issue 13, pp. 2408-2413 (2002)

http://dx.doi.org/10.1364/AO.41.002408

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### Abstract

Seidel aberration coefficients can be expressed by Zernike coefficients. The least-squares matrix-inversion method of determining Zernike coefficients from a sampled wave front with measurement noise has been found to be numerically unstable. We present a method of estimating the Seidel aberration coefficients by using a two-dimensional discrete wavelet transform. This method is applied to analyze the wave front of an optical system, and we obtain not only more-accurate Seidel aberration coefficients, but we also speed the computation. Three simulated wave fronts are fitted, and simulation results are shown for spherical aberration, coma, astigmatism, and defocus.

© 2002 Optical Society of America

**OCIS Codes**

(100.2650) Image processing : Fringe analysis

(100.5070) Image processing : Phase retrieval

(100.7410) Image processing : Wavelets

**History**

Original Manuscript: November 14, 2001

Published: May 1, 2002

**Citation**

Rong-Seng Chang, Jin-Yi Sheu, and Ching-Huang Lin, "Analysis of Seidel aberration by use of the discrete wavelet transform," Appl. Opt. **41**, 2408-2413 (2002)

http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-13-2408

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