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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 13 — May. 1, 2002
  • pp: 2428–2434

Polarization-dependent angular-optical reflectance in solar-selective SnO x :F/Al2O3/Al reflector surfaces

Mghendi Mwamburi, Ewa Wäckelgård, Arne Roos, and Rogath Kivaisi  »View Author Affiliations


Applied Optics, Vol. 41, Issue 13, pp. 2428-2434 (2002)
http://dx.doi.org/10.1364/AO.41.002428


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Abstract

Polarization-dependent angular-optical properties of spectrally selective reflector surfaces of fluorine-doped tin oxide (SnO x :F) deposited pyrolytically on anodized aluminum are reported. The angular-reflectance measurements, for which both s- and p-polarized light are used in the solar wavelength range 0.3–2.5 µm, reveal strong spectral selectivity, and the angular behavior is highly dependent on the polarizing component of the incident beam, the total film thickness, and the individual thickness of the Al2O3 and the SnO x :F layers. The anodic Al2O3 layers were produced electrochemically and varied between 100 and 205 nm in thickness. The SnO x :F films were grown pyrolytically at a temperature of 400 °C with film thicknesses varying in the range 180–320 nm. The reflectors were aimed at silicon solar cells, and good spectrally selective reflector characteristics were achieved with these thinly preanodized, SnO x :F/Al samples; that is, high cell reflectance was obtained for wavelengths below 1.1 µm and low thermal reflectance for wavelengths above 1.1 µm, with the best samples having values of 0.80 and 0.42, respectively, at near-normal angles of incidence. This corresponds to an anodic layer thickness of 155 nm. Both the angular calculations and the experimental measurements show that the cell reflectance is relatively insensitive to the incidence angle, and a low thermal reflectance is maintained up to an angle of ∼60°.

© 2002 Optical Society of America

OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(160.4760) Materials : Optical properties
(230.4170) Optical devices : Multilayers
(310.6860) Thin films : Thin films, optical properties
(350.6050) Other areas of optics : Solar energy

History
Original Manuscript: January 2, 2001
Revised Manuscript: January 3, 2002
Published: May 1, 2002

Citation
Mghendi Mwamburi, Ewa Wäckelgård, Arne Roos, and Rogath Kivaisi, "Polarization-dependent angular-optical reflectance in solar-selective SnOx:F/Al2O3/Al reflector surfaces," Appl. Opt. 41, 2428-2434 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-13-2428


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References

  1. M. Mwamburi, E. Wäckelgård, A. Roos, “Preparation and characterisation of solar selective SnOx:F coated aluminium reflector surfaces,” Thin Solid Films 374, 1–9 (2000). [CrossRef]
  2. I. Hamberg, C. G. Granqvist, “Evaporated Sn-doped In2O3 films: basic optical properties and applications to energy-efficient windows,” J. Appl. Phys. 60, 123–159 (1986). [CrossRef]
  3. B. Stjerna, E. Olsson, C. G. Granqvist, “Optical and electrical properties of rf sputtered tin oxide films doped with oxygen vacancies, F, Sb or Mo,” J. Appl. Phys. 76, 3797–3817 (1994). [CrossRef]
  4. M. Mwamburi, B. Karlsson, R. T. Kivaisi, “Transparent conductor coated aluminium reflectors for PV applications,” in Proceedings of The Seventh International Conference on Solar Energy at High Latitudes, Vol. 2 of the Proceedings of the North Sun Series, P. Konttinen, P. D. Lund, eds. (Tummavuoven Kirjapaino Oy, Helsinki, 1997), pp. 659–666.
  5. E. Shanti, A. Banerjee, V. Dutta, K. L. Chopra, “Electrical and optical properties of tin oxide films doped with F and (Sb + F),” J. Appl. Phys. 53, 1615–1621 (1982). [CrossRef]
  6. M. Mwamburi, E. Wäckelgård, B. Karlsson, “Optical properties of SnOx:F/Al2O3/Al solar selective reflector surfaces,” presented at the Third International ISES Europe Solar Congress, Copenhagen, Denmark, 19–22 June 2000.
  7. M. Mwamburi, E. Wäckelgård, “Doped tin oxide coated aluminium solar selective reflector surfaces,” Sol. Energy 68-4, 371–378 (2000). [CrossRef]
  8. G. Patermarakis, “Development of a theory for the determination of the composition of the anodizing solution inside the pores during the growth of anodic Al2O3 films on aluminium by a transport phenomenon analysis,” J. Electroanal. Chem. 447, 25–41 (1998). [CrossRef]
  9. J. P. O’Sullivan, G. C. Wood, “The morphology and mechanism of formation of porous anodic films on aluminium,” Proc. R. Soc. Lond. A 317, 511–543 (1970). [CrossRef]
  10. E. Palibroda, A. Lupsan, S. Pruneanu, M. Savos, “Aluminium porous oxide growth: on the electric conductivity of the barrier layer,” Thin Solid Films 256, 101–105 (1995). [CrossRef]
  11. T. S. Eriksson, A. Hjortsberg, G. A. Niklasson, C. G. Granqvist, “Infrared optical properties of evaporated alumina films,” Appl. Opt. 20, 2742–2746 (1981). [CrossRef] [PubMed]
  12. A. Roos, “Optical properties of pyrolytic tin oxide on aluminium,” Thin Solid Films 203, 41–48 (1991). [CrossRef]
  13. H. A. Macleod, Thin Film Optical Filters (McGraw-Hill, Hilger, London, 1969), Vol. II.
  14. A. Roos, “Optical characterization of coated glazings at oblique angles of incidence: measurements versus model calculations,” J. Non-Cryst. Solids 218, 245–255 (1997). [CrossRef]
  15. G. Patermarakis, “Transformation of the overall strict kinetic model governing the growth of anodic Al2O3 films on aluminium to a form applicable to the non-stirred bath film growth,” Electrochim. Acta 40, 2601–2611 (1996). [CrossRef]
  16. O. P. Agnihotri, B. K. Gupta, Solar Selective Surfaces (Wiley-Interscience, New York, 1981).
  17. M. Berkvist, A. Roos, C-G. Ribbing, “Interference structure in optical scattering from oxide/metal interfaces,” J. Vac. Sci. Technol. A 5, 1661–1665 (1987). [CrossRef]
  18. I. Lindseth, A. Bardal, R. Spooren, “Reflectance measurements of aluminium surfaces using integrating spheres,” Opt. Lasers Eng. 32, 419–435 (1999). [CrossRef]

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