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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 13 — May. 1, 2002
  • pp: 2448–2453

Grating-based real-time polarization phase-shifting interferometry: error analysis

Qian Kemao, Wu Xiaoping, and Anand Asundi  »View Author Affiliations


Applied Optics, Vol. 41, Issue 13, pp. 2448-2453 (2002)
http://dx.doi.org/10.1364/AO.41.002448


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Abstract

A phase Ronchi grating-based real-time polarization phase-shifting method can be efficiently used for dynamic phase measurement in optical interferometry. A thorough error analysis is required for exhibiting how error sources influence phase-measurement results. We analyze the phase-measurement errors that are induced by the retardation error and azimuth angle error of the quarter-wave plate, the azimuth angle error of polarizers, the phase and intensity aberrations of diffractive wave fronts, and pixel mismatch of the interferometric patterns. The results will also be useful for evaluating the phase-measurement accuracy of other similar systems.

© 2002 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

History
Original Manuscript: April 28, 2001
Revised Manuscript: December 11, 2001
Published: May 1, 2002

Citation
Qian Kemao, Wu Xiaoping, and Anand Asundi, "Grating-based real-time polarization phase-shifting interferometry: error analysis," Appl. Opt. 41, 2448-2453 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-13-2448


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