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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 13 — May. 1, 2002
  • pp: 2546–2554

Index determination of opaque and semitransparent metallic films: application to light absorbers

Michel Cathelinaud, Frédéric Lemarquis, and Claude Amra  »View Author Affiliations


Applied Optics, Vol. 41, Issue 13, pp. 2546-2554 (2002)
http://dx.doi.org/10.1364/AO.41.002546


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Abstract

Index-determination methods based on reflectance and transmittance measurements are developed for both opaque and semitransparent metallic films. Results are given concerning chromium and nickel layers manufactured by electron-beam deposition. To take account of the evolution of the optical constants versus layer thickness, an inhomogeneous layer model is used, which permits us to obtain a good agreement between measurements and calculations. Results are applied to the design and manufacture of light absorbers for which accurate index knowledge is required. Measured absorption is higher than 0.999 on both broadband and monochromatic components.

© 2002 Optical Society of America

OCIS Codes
(160.3900) Materials : Metals
(310.1210) Thin films : Antireflection coatings
(310.6860) Thin films : Thin films, optical properties
(350.2450) Other areas of optics : Filters, absorption

History
Original Manuscript: May 16, 2001
Revised Manuscript: November 27, 2001
Published: May 1, 2002

Citation
Michel Cathelinaud, Frédéric Lemarquis, and Claude Amra, "Index determination of opaque and semitransparent metallic films: application to light absorbers," Appl. Opt. 41, 2546-2554 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-13-2546


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