Index-determination methods based on reflectance and transmittance measurements are developed for both opaque and semitransparent metallic films. Results are given concerning chromium and nickel layers manufactured by electron-beam deposition. To take account of the evolution of the optical constants versus layer thickness, an inhomogeneous layer model is used, which permits us to obtain a good agreement between measurements and calculations. Results are applied to the design and manufacture of light absorbers for which accurate index knowledge is required. Measured absorption is higher than 0.999 on both broadband and monochromatic components.
© 2002 Optical Society of America
Original Manuscript: May 16, 2001
Revised Manuscript: November 27, 2001
Published: May 1, 2002
Michel Cathelinaud, Frédéric Lemarquis, and Claude Amra, "Index determination of opaque and semitransparent metallic films: application to light absorbers," Appl. Opt. 41, 2546-2554 (2002)