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Applied Optics

Applied Optics


  • Vol. 41, Iss. 15 — May. 20, 2002
  • pp: 2831–2839

Removing Aperture-Induced Artifacts from Fourier Transform Infrared Intensity Values

Timothy J. Johnson, Robert L. Sams, Thomas A. Blake, Steven W. Sharpe, and Pamela M. Chu  »View Author Affiliations

Applied Optics, Vol. 41, Issue 15, pp. 2831-2839 (2002)

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Two Fourier transform infrared intensity artifacts have been observed at moderately high (0.1 cm−1) spectral resolution: Light reflected off the aperture was double modulated by the interferometer, producing a 2f alias, and the warm (≈310 K) annulus of the aperture seen by a cooled detector resulted in distorted line shapes and anomalous intensities in the fingerprint region. Although the second artifact has been alluded to previously, we report corrections to remove both of these anomalies and to demonstrate the efficacy of these corrections. Prior to correction, integrated-band intensities were found to be in error by up to 12%.

© 2002 Optical Society of America

OCIS Codes
(070.2590) Fourier optics and signal processing : ABCD transforms
(110.1220) Imaging systems : Apertures
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(300.6320) Spectroscopy : Spectroscopy, high-resolution
(300.6340) Spectroscopy : Spectroscopy, infrared

Timothy J. Johnson, Robert L. Sams, Thomas A. Blake, Steven W. Sharpe, and Pamela M. Chu, "Removing Aperture-Induced Artifacts from Fourier Transform Infrared Intensity Values," Appl. Opt. 41, 2831-2839 (2002)

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