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Applied Optics

Applied Optics


  • Vol. 41, Iss. 16 — Jun. 1, 2002
  • pp: 3039–3052

Topical Meeting on Optical Interference Coatings (OIC’2001): manufacturing problem

J. A. Dobrowolski, Stephen Browning, Michael Jacobson, and Maria Nadal  »View Author Affiliations

Applied Optics, Vol. 41, Issue 16, pp. 3039-3052 (2002)

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Measurements are presented of the experimental filters submitted to the first optical thin-film manufacturing problem posed in conjunction with the Topical Meeting on Optical Interference Coatings, in which the object was to produce multilayers with spectral transmittance and reflectance curves that were as close as possible to the target values that were specified in the 400- to 600-nm spectral region. No limit was set on the overall thickness of the solutions or the number of layers used in their construction. The participants were free to use the coating materials of their choice. Six different groups submitted a total of 11 different filters for evaluation. Three different physical vapor deposition processes were used for the manufacture of the coatings: magnetron sputtering, ion-beam sputtering, and plasma-ion-assisted, electron-beam gun evaporation. The solutions ranged in metric thickness from 758 to 4226 nm and consisted of between 8 and 27 layers. For all but two of the samples submitted, the average rms departure of the measured transmittances and reflectances from the target values in the spectral region of interest was between 0.98% and 1.55%.

© 2002 Optical Society of America

OCIS Codes
(120.2440) Instrumentation, measurement, and metrology : Filters
(310.1620) Thin films : Interference coatings
(310.1860) Thin films : Deposition and fabrication

Original Manuscript: October 12, 2001
Revised Manuscript: January 3, 2002
Published: June 1, 2002

J. A. Dobrowolski, Stephen Browning, Michael Jacobson, and Maria Nadal, "Topical Meeting on Optical Interference Coatings (OIC’2001): manufacturing problem," Appl. Opt. 41, 3039-3052 (2002)

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