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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 16 — Jun. 1, 2002
  • pp: 3118–3126

Multiwavelength imaging of defects in ultraviolet optical materials

Annelise During, Caroline Fossati, and Mireille Commandré  »View Author Affiliations


Applied Optics, Vol. 41, Issue 16, pp. 3118-3126 (2002)
http://dx.doi.org/10.1364/AO.41.003118


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Abstract

Laser-induced damage in bare glass substrates and thin films has long been widely acknowledged as a localized phenomenon associated with the presence of micrometer and submicrometer scale defects. The scanning of both optical absorption and scattering allows us to discriminate between absorbing and nonabsorbing defects and can give specific information about the origin of the defects. We investigate the spectral properties of defects in thin films and fused-silica surfaces. Absorbing and scattering defects are studied at different wavelengths in the ultraviolet, visible, and infrared ranges. Absorbing defects are shown to be highly wavelength dependent, whereas we have observed significant correlation between scattering defects.

© 2002 Optical Society of America

OCIS Codes
(240.0310) Optics at surfaces : Thin films
(240.6490) Optics at surfaces : Spectroscopy, surface
(310.3840) Thin films : Materials and process characterization

History
Original Manuscript: October 3, 2001
Revised Manuscript: January 16, 2002
Published: June 1, 2002

Citation
Annelise During, Caroline Fossati, and Mireille Commandré, "Multiwavelength imaging of defects in ultraviolet optical materials," Appl. Opt. 41, 3118-3126 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-16-3118


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