Guided-wave Technique for the Measurement of Dielectric Thin-Film Materials’ Thermal Properties
Applied Optics, Vol. 41, Issue 16, pp. 3127-3131 (2002)
http://dx.doi.org/10.1364/AO.41.003127
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Abstract
A pump-and-probe setup that uses a totally reflecting prism coupler is presented. Its electromagnetic and thermal models are described. To our knowledge, the first results are given concerning the measurement of thermal properties of thin films.
© 2002 Optical Society of America
OCIS Codes
(120.6810) Instrumentation, measurement, and metrology : Thermal effects
(310.2790) Thin films : Guided waves
Citation
Pascal Huguet-Chantôme, Ludovic Escoubas, and François Flory, "Guided-wave Technique for the Measurement of Dielectric Thin-Film Materials’ Thermal Properties," Appl. Opt. 41, 3127-3131 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-16-3127
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