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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 16 — Jun. 1, 2002
  • pp: 3127–3131

Guided-wave technique for the measurement of dielectric thin-film materials’ thermal properties

Pascal Huguet-Chantôme, Ludovic Escoubas, and François Flory  »View Author Affiliations


Applied Optics, Vol. 41, Issue 16, pp. 3127-3131 (2002)
http://dx.doi.org/10.1364/AO.41.003127


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Abstract

A pump-and-probe setup that uses a totally reflecting prism coupler is presented. Its electromagnetic and thermal models are described. To our knowledge, the first results are given concerning the measurement of thermal properties of thin films.

© 2002 Optical Society of America

OCIS Codes
(120.6810) Instrumentation, measurement, and metrology : Thermal effects
(310.2790) Thin films : Guided waves

History
Original Manuscript: September 28, 2001
Published: June 1, 2002

Citation
Pascal Huguet-Chantôme, Ludovic Escoubas, and François Flory, "Guided-wave technique for the measurement of dielectric thin-film materials’ thermal properties," Appl. Opt. 41, 3127-3131 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-16-3127


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References

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