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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 16 — Jun. 1, 2002
  • pp: 3132–3136

n/∂T measurements performed with guided waves and their application to the temperature sensitivity of wavelength-division multiplexing filters

Emmanuel Drouard, Pascal Huguet-Chantôme, Ludovic Escoubas, and François Flory  »View Author Affiliations


Applied Optics, Vol. 41, Issue 16, pp. 3132-3136 (2002)
http://dx.doi.org/10.1364/AO.41.003132


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Abstract

Measurements of ∂n/∂T of thin films by the m-lines technique are presented. The importance of the substrate material is shown. An example of the wavelength shift of an optical thin-film filter with temperature is studied both theoretically and experimentally. The theoretical wavelength shift of a dense wavelength-division multiplexing filter is discussed.

© 2002 Optical Society of America

OCIS Codes
(310.6860) Thin films : Thin films, optical properties
(350.2460) Other areas of optics : Filters, interference

History
Original Manuscript: September 28, 2001
Revised Manuscript: January 2, 2002
Published: June 1, 2002

Citation
Emmanuel Drouard, Pascal Huguet-Chantôme, Ludovic Escoubas, and François Flory, "∂n/∂T measurements performed with guided waves and their application to the temperature sensitivity of wavelength-division multiplexing filters," Appl. Opt. 41, 3132-3136 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-16-3132

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