Measurements of ∂<i>n</i>/∂<i>T</i> of thin films by the <i>m</i>-lines technique are presented. The importance of the substrate material is shown. An example of the wavelength shift of an optical thin-film filter with temperature is studied both theoretically and experimentally. The theoretical wavelength shift of a dense wavelength-division multiplexing filter is discussed.
© 2002 Optical Society of America
Emmanuel Drouard, Pascal Huguet-Chantôme, Ludovic Escoubas, and François Flory, "∂n/∂T Measurements performed with guided waves and Their Application to the Temperature Sensitivity of Wavelength-Division Multiplexing Filters," Appl. Opt. 41, 3132-3136 (2002)