Measurements of ∂n/∂T of thin films by the m-lines technique are presented. The importance of the substrate material is shown. An example of the wavelength shift of an optical thin-film filter with temperature is studied both theoretically and experimentally. The theoretical wavelength shift of a dense wavelength-division multiplexing filter is discussed.
© 2002 Optical Society of America
Original Manuscript: September 28, 2001
Revised Manuscript: January 2, 2002
Published: June 1, 2002
Emmanuel Drouard, Pascal Huguet-Chantôme, Ludovic Escoubas, and François Flory, "∂n/∂T measurements performed with guided waves and their application to the temperature sensitivity of wavelength-division multiplexing filters," Appl. Opt. 41, 3132-3136 (2002)