OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 16 — Jun. 1, 2002
  • pp: 3132–3136

n/∂T measurements performed with guided waves and their application to the temperature sensitivity of wavelength-division multiplexing filters

Emmanuel Drouard, Pascal Huguet-Chantôme, Ludovic Escoubas, and François Flory  »View Author Affiliations


Applied Optics, Vol. 41, Issue 16, pp. 3132-3136 (2002)
http://dx.doi.org/10.1364/AO.41.003132


View Full Text Article

Enhanced HTML    Acrobat PDF (131 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Measurements of ∂n/∂T of thin films by the m-lines technique are presented. The importance of the substrate material is shown. An example of the wavelength shift of an optical thin-film filter with temperature is studied both theoretically and experimentally. The theoretical wavelength shift of a dense wavelength-division multiplexing filter is discussed.

© 2002 Optical Society of America

OCIS Codes
(310.6860) Thin films : Thin films, optical properties
(350.2460) Other areas of optics : Filters, interference

History
Original Manuscript: September 28, 2001
Revised Manuscript: January 2, 2002
Published: June 1, 2002

Citation
Emmanuel Drouard, Pascal Huguet-Chantôme, Ludovic Escoubas, and François Flory, "∂n/∂T measurements performed with guided waves and their application to the temperature sensitivity of wavelength-division multiplexing filters," Appl. Opt. 41, 3132-3136 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-16-3132


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. W. H. Cheng, S. F. Chi, A. K. Chu, “Effect of thermal stresses on temperature of refractive index for Ta2O5 dielectric films,” Thin Solid Films 347, 233–237 (1999). [CrossRef]
  2. R. Ulrich, R. Torge, “Measurement of thin film parameters with a prism coupler,” Appl. Opt. 12, 2901–2908 (1973). [CrossRef] [PubMed]
  3. F. Flory, “Guided wave techniques for the characterization of optical coatings,” in Thin Films for Optical Systems, F. Flory, ed., Vol. 49 of Optical Engineering Series (Marcel Dekker, New York; 1995), pp. 393–454.
  4. S. Monneret, P. Huguet-Chantôme, F. Flory, “m-lines technique: prism coupling measurement and discussion of accuracy for homogeneous waveguides,” J. Opt. A 2, 188–195 (2000). [CrossRef]
  5. F. Flory, N. Maythaveekulchai, H. Rigneault, F. Zamkotsian, “Characterization by guided wave of instabilities of optical coatings submitted to high power flux: thermal and third order nonlinear properties of dielectric thin films,” Appl. Opt. 32, 5628–5639 (1993). [CrossRef] [PubMed]
  6. M. Bass, ed., Handbook of Optics, 2nd ed. (McGraw-Hill, New York, 1995).
  7. H. Takashashi, “Temperature stability of thin-film narrow-bandpass filters produced by ion-assisted deposition,” Appl. Opt. 34, 667–675 (1995). [CrossRef] [PubMed]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1 Fig. 2 Fig. 3
 
Fig. 4 Fig. 5
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited