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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 16 — Jun. 1, 2002
  • pp: 3142–3149

Pit formation observed in a multilayer dielectric coating as a result of simulated space environmental exposure

Peter D. Fuqua, Nathan Presser, James D. Barrie, Michael J. Meshishnek, and Dianne J. Coleman  »View Author Affiliations


Applied Optics, Vol. 41, Issue 16, pp. 3142-3149 (2002)
http://dx.doi.org/10.1364/AO.41.003142


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Abstract

Certain spaceborne telescope designs require that dielectric-coated lenses be exposed to the energetic electrons and protons associated with the space environment. Test coupons that were exposed to a simulated space environment showed extensive pitting as a result of dielectric breakdown. A typical pit was 50–100 μm at the surface and extended to the substrate material, in which a 10-μm-diameter melt region was found. Pitting was not observed on similar samples that had also been overcoated with a transparent conductive thin film. Measurement of the bidirectional reflectance distribution transfer function showed that pitting caused a fivefold to tenfold increase in the scattering of visible light.

© 2002 Optical Society of America

OCIS Codes
(310.6870) Thin films : Thin films, other properties
(350.6090) Other areas of optics : Space optics

Citation
Peter D. Fuqua, Nathan Presser, James D. Barrie, Michael J. Meshishnek, and Dianne J. Coleman, "Pit formation observed in a multilayer dielectric coating as a result of simulated space environmental exposure," Appl. Opt. 41, 3142-3149 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-16-3142

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