OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 16 — Jun. 1, 2002
  • pp: 3167–3171

Single-layer model for surface roughness

C. K. Carniglia and D. G. Jensen  »View Author Affiliations


Applied Optics, Vol. 41, Issue 16, pp. 3167-3171 (2002)
http://dx.doi.org/10.1364/AO.41.003167


View Full Text Article

Enhanced HTML    Acrobat PDF (72 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Random roughness of an optical surface reduces its specular reflectance and transmittance by the scattering of light. The reduction in reflectance can be modeled by a homogeneous layer on the surface if the refractive index of the layer is intermediate to the indices of the media on either side of the surface. Such a layer predicts an increase in the transmittance of the surface and therefore does not provide a valid model for the effects of scatter on the transmittance. Adding a small amount of absorption to the layer provides a model that predicts a reduction in both reflectance and transmittance. The absorbing layer model agrees with the predictions of a scalar scattering theory for a layer with a thickness that is twice the rms roughness of the surface. The extinction coefficient k for the layer is proportional to the thickness of the layer.

© 2002 Optical Society of America

OCIS Codes
(290.5880) Scattering : Scattering, rough surfaces
(310.6860) Thin films : Thin films, optical properties

History
Original Manuscript: October 8, 2001
Revised Manuscript: December 18, 2001
Published: June 1, 2002

Citation
C. K. Carniglia and D. G. Jensen, "Single-layer model for surface roughness," Appl. Opt. 41, 3167-3171 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-16-3167


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. P. Beckmann, A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces (Pergamon, New York, 1963).
  2. C. K. Carniglia, “Scalar scattering theory for multilayer optical coatings,” Opt. Eng. 18, 104–115 (1979). [CrossRef]
  3. A. V. Tikhonravov, M. K. Trubetskov, A. A. Tikhonravov, A. Duparré, “Impact of surface roughness on spectral properties of thin films and multilayers,” in Optical Interference Coatings, 2001 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 2001), paper ThB5.
  4. D. E. Aspnes, J. B. Theeten, F. Hottier, “Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry,” Phys. Rev. B 20, 3292–3302 (1979). [CrossRef]
  5. H. G. Tompkins, A User’s Guide to Ellipsometry (Academic, San Diego, Calif., 1993).
  6. H. A. Macleod, Thin-Film Optical Filters, 2nd ed. (Macmillan, New York, 1986).
  7. C. K. Carniglia, D. G. Jensen, G. A. Clarke, “The equivalence between surface roughness and a homogeneous layer on the surface,” presented at the OSA Annual Meeting (Providence, R. I., 22–26 Oct. 2000), Conference Program, paper ThG3.

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited