OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 16 — Jun. 1, 2002
  • pp: 3172–3175

Group delay and chromatic dispersion of thin-film-based, narrow bandpass filters used in dense wavelength-division-multiplexed systems

Keqi Zhang, Jue Wang, Erik Schwendeman, David Dawson-Elli, Ralf Faber, and Robert Sharps  »View Author Affiliations


Applied Optics, Vol. 41, Issue 16, pp. 3172-3175 (2002)
http://dx.doi.org/10.1364/AO.41.003172


View Full Text Article

Enhanced HTML    Acrobat PDF (95 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Theoretical analysis is made for thin-film-based, 200- and 100-GHz narrow bandpass filters with respect to the intensity response as well as to the chromatic dispersion. The results indicate that the narrower the passband, the higher the chromatic dispersion. The maximum chromatic dispersion appears at the edges of the 0.5-dB passband, owing to the fast change of the group delay in the region. The deviation of chromatic dispersion induced by manufacturing error is simulated. Effective-medium approximation layers are added to simulate the contribution of surface roughness and the mixture interfaces to the passband ripple as well as the chromatic dispersion. The simulations are compared with the experimental results. The measured chromatic dispersion matches the general trend of the theoretical calculation. The imperfect surface and layer mismatch induce additional ripples across the 0.5-dB passband. The maximum chromatic dispersion within a 0.5-dB passband is 20.7 and 54.9 ps/nm for 200- and 100-GHZ narrow bandpass filters, respectively.

© 2002 Optical Society of America

OCIS Codes
(060.2340) Fiber optics and optical communications : Fiber optics components
(310.6860) Thin films : Thin films, optical properties

History
Original Manuscript: September 28, 2001
Published: June 1, 2002

Citation
Keqi Zhang, Jue Wang, Erik Schwendeman, David Dawson-Elli, Ralf Faber, and Robert Sharps, "Group delay and chromatic dispersion of thin-film-based, narrow bandpass filters used in dense wavelength-division-multiplexed systems," Appl. Opt. 41, 3172-3175 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-16-3172


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. G. Lenz, B. J. Eggleton, C. R. Giles, C. K. Madsen, R. E. Slusher, “Dispersive properties of optical filters for WDM systems,” IEEE J. Quantum Electron. 34, 1390–1402 (1998). [CrossRef]
  2. G. Lenz, B. J. Eggleton, C. K. Madsen, C. R. Giles, G. Nykolak, “Optimal dispersion of optical filters for WDM systems,” IEEE Photon. Technol. Lett. 10, 567–569 (1998). [CrossRef]
  3. C. K. Madsen, “General IIR optical filter design for WDM applications using all-pass filters,” J. Lightwave Technol. 18, 860–868 (2000). [CrossRef]
  4. A. Zöller, R. Götzelmann, K. Matl, D. Cushing, “Temperature-stable bandpass filters deposited with plasma ion-assisted deposition,” Appl. Opt. 35, 5609–5612 (1996). [CrossRef] [PubMed]
  5. P. Baumeister, “Bandpass filters for wavelength division multiplexing—modification of the spectral bandwidth,” Appl. Opt. 37, 6609–6614 (1998). [CrossRef]
  6. L. Rolland, C. Vallee, M. C. Peignon, C. Cardinaud, “Roughness and chemistry of silicon and polysilicon surface etched in high-density plasma: XPS, AFM and ellipsometry analysis,” Appl. Surf. Sci. 164, 147–155 (2000). [CrossRef]
  7. S. Jakobs, A. Duparre, M. Huter, H. K. Pulker, “Surface roughness characterization of smooth optical films deposited by ion plating,” Thin Solid Films, 351, 141–145 (1999). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1 Fig. 2 Fig. 3
 
Fig. 4
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited