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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 16 — Jun. 1, 2002
  • pp: 3176–3182

Automated design and sensitivity analysis of wavelengh-division multiplexing filters

Alexander V. Tikhonravov and Michael K. Trubetskov  »View Author Affiliations


Applied Optics, Vol. 41, Issue 16, pp. 3176-3182 (2002)
http://dx.doi.org/10.1364/AO.41.003176


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Abstract

An automated approach to the design of wavelength-division multiplexing (WDM) filters is based on the combination of ideas from classical design approaches with an integer optimization technique. This approach turns out to be extremely efficient from a computational point of view and makes it possible to construct a set of significantly different filter designs with nearly equivalent spectral properties. The sensitivity of WDM filters is analyzed by a computer simulation of the deposition process with turning-point optical monitoring. This analysis enables the designer to compare feasibility properties of various filter designs.

© 2002 Optical Society of America

OCIS Codes
(310.0310) Thin films : Thin films
(350.2460) Other areas of optics : Filters, interference

History
Original Manuscript: September 29, 2001
Revised Manuscript: January 22, 2002
Published: June 1, 2002

Citation
Alexander V. Tikhonravov and Michael K. Trubetskov, "Automated design and sensitivity analysis of wavelengh-division multiplexing filters," Appl. Opt. 41, 3176-3182 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-16-3176


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References

  1. H. A. Macleod, “Turning value monitoring of narrow-band all-dielectric thin film optical filters,” Opt. Acta 19, 1–28 (1972). [CrossRef]
  2. P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, P. Roche, “Optical filters: monitoring process allowing the auto-correction of thickness errors,” Thin Solid Films 13, 285–290 (1972). [CrossRef]
  3. S. A. Furman, Thin-Film Optical Coatings (Mashinosroenie, Leningrad, 1977) (in Russian).
  4. S. Furman, A. V. Tikhonravov, Basics of Optics of Multilayer Systems (Edition Frontieres, Gif-sur-Yvette, 1992).
  5. A. V. Tikhonravov, M. K. Trubetskov, G. DeBell, “Application of the needle optimization technique to the design of optical coatings,” Appl. Opt. 35, 5493–5508 (1996). [CrossRef] [PubMed]
  6. G. Mathaei, L. Young, E. M. T. Jones, Microwave Filters, Impedance Matching Networks, and Coupling Structures (McGraw-Hill, New York, 1964).
  7. P. Baumeister, “Design of a WDM bandpass with quasi-Chebyshev spectral shape,” Appl. Opt. 40, 1132–1137 (2001). [CrossRef]
  8. A. Thelen, “Equivalent layers in multilayer filters,” J. Opt. Soc. Am. 56, 1533–1538 (1966). [CrossRef]
  9. A. Thelen, Design of Optical Interference Coatings (McGraw-Hill, New York, 1988).
  10. P. Baumeister, Optical Coating Technology (1998), book used at a five-day short course, Engineering 823.17, University of California at Los Angeles, Department of Engineering, Information Systems and Technical Management, 12–16 January, 1998.
  11. M. Abramowitz, I. Stegun, eds., Handbook of Mathematical Functions with Formulas, Graphs and Mathematical Tables, Applied Mathematics Series 55 (National Bureau of Standards, Gaithersburg, Md., 1964).
  12. I. V. Sergienko, Mathematical Models and Methods for Solution of Discrete Optimization Problems (Naukova Dumka, Kiev, 1988) (in Russian).
  13. A. N. Tikhonov, V. Y. Arsenin, Solution of Ill-Posed Problems (Winston-Wiley, New York, 1977).

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