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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 16 — Jun. 1, 2002
  • pp: 3193–3195

Simulation of Errors in the Monitoring of Narrow Bandpass Filters

Ronald R. Willey  »View Author Affiliations


Applied Optics, Vol. 41, Issue 16, pp. 3193-3195 (2002)
http://dx.doi.org/10.1364/AO.41.003193


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Abstract

Narrow bandpass filters are extremely sensitive to errors in the optical thickness of the layers, but they have an extraordinary inherent capability to compensate for these errors. Graphical examples of errors of differing magnitudes and types with and without compensation are shown with computer simulation of the optical monitoring techniques. This allows the estimation of what magnitude of errors may be tolerable in given applications.

© 2002 Optical Society of America

OCIS Codes
(310.0310) Thin films : Thin films
(310.1620) Thin films : Interference coatings
(310.1860) Thin films : Deposition and fabrication

Citation
Ronald R. Willey, "Simulation of Errors in the Monitoring of Narrow Bandpass Filters," Appl. Opt. 41, 3193-3195 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-16-3193


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References

  1. R. R. Willey, “Estimating the properties of DWDM filters before designing and their error sensitivity and compensation effects in production,” Proc. Soc. Vac. Coaters 44, 262–266 (2001).
  2. R. R. Willey, “Achieving narrow bandpass filters which meet the performance required for DWDM,” Thin Solid Films 398–399, 1–9 (2001).
  3. F. Q. Zhou, M. Zhou, and J. J. Pan, “Optical coating computer simulation of narrow bandpass filters for dense wavelength division multiplexing,” Optical Interference Coatings, Vol. 9 of OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1998), pp. 223–225.
  4. P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, and P. Roche, “Optical filters: monitoring process allowing the auto-correction of thickness errors,” Thin Solid Films 13, 285–290 (1972).
  5. H. A. Macleod, “Turning value monitoring of narrow-band all-dielectric thin-film optical filters,” Opt Acta 19, 1–28 (1972).
  6. H. A. Macleod and D. Richmond, The effects of errors on the optical monitoring of narrow-band all-dielectric thin film optical filters,” Opt Acta 21, 429–443 (1974).
  7. L. E. Regalado and R. Garcia-Llamas, “Method for calculating optical coating error stabilities,” Appl. Opt. 32, 5677–5682 (1993).

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