Add to BibSonomyAbstract
Piezoelectric transparent thin films are of great interest for use in tunable filters. We present experimental results on Ta2O5 single layers coated on fused-silica substrates with an electron-beam deposition process. Above 450 °C, coatings change from an amorphous to a polycrystallized structure. When this structure shows a preferred orientation matching the piezoelectric tensor of the Ta2O5 crystal and the external electric field, variation in the piezoelectric layer thickness is expected. We detail experimental results in terms of optical (spectrophotometric and scattering measurements) and nonoptical characterizations (x-ray diffraction and scanning electron microscopy). Then the resultant thickness variation under oscillating applied voltage is measured with an extrinsic Fabry-Perot interferometer setup.
© 2002 Optical Society of America
Full Article | PDF ArticleMore Like This
Timothy J. Rehg, J. Alberto Ochoa-Tapia, André Knoesen, and Brian G. Higgins
Appl. Opt. 28(24) 5215-5221 (1989)
Michel Lequime, Remy Parmentier, Fabien Lemarchand, and Claude Amra
Appl. Opt. 41(16) 3277-3284 (2002)
Detlev Ristau, Stefan Günster, Salvador Bosch, Angela Duparré, Enrico Masetti, Josep Ferré-Borrull, George Kiriakidis, Francesca Peiró, Etienne Quesnel, and Alexander Tikhonravov
Appl. Opt. 41(16) 3196-3204 (2002)