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Applied Optics

Applied Optics


  • Vol. 41, Iss. 16 — Jun. 1, 2002
  • pp: 3332–3335

Artificial anisotropy and polarizing filters

François Flory, Ludovic Escoubas, and Basile Lazaridès  »View Author Affiliations

Applied Optics, Vol. 41, Issue 16, pp. 3332-3335 (2002)

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The calculated spectral transmittance of a multilayer laser mirror is used to determine the effective index of the single layer equivalent to the multilayer stack. We measure the artificial anisotropy of photoresist thin films whose structure is a one-dimensional, subwavelength grating obtained from interference fringes. The limitation of the theory of the first-order effective index homogenization is discussed. We designed normal-incidence, polarizing coating and a polarization rotator by embedding anisotropic films in simple multilayer structures.

© 2002 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(260.1440) Physical optics : Birefringence

Original Manuscript: October 5, 2001
Revised Manuscript: January 22, 2002
Published: June 1, 2002

François Flory, Ludovic Escoubas, and Basile Lazaridès, "Artificial anisotropy and polarizing filters," Appl. Opt. 41, 3332-3335 (2002)

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  1. I. Hodgkinson, Q. Wu, Birefringent Thin Films and Polarizing Elements (World Scientific, Singapore, 1997).
  2. F. Flory, D. Endelema, E. Pelletier, I. Hodgkinson, “Anisotropy in thin films: modeling and measurement of guided and nonguided optical properties: application to TiO2 films,” Appl. Opt. 32, 5649–5659 (1993). [CrossRef] [PubMed]
  3. F. Flory, “Consequences of the microstructure of thin films on their optical properties,” in Thin Film Physics and Applications, S. Zhou, Y. Hsang, Y.-K. Chen, S. Mao, eds., Proc. SPIE2364, 27–35, (1994).
  4. T. Motohiro, Y. Taga, “Thin film retardation plate by oblique deposition,” Appl. Opt. 28, 2466–2482 (1989). [CrossRef] [PubMed]
  5. E. Grann, M. Moharam, A. Pommet, “Artificial uniaxial and biaxial dielectrics with use of two-dimensional subwavelength binary gratings,” J. Opt. Soc. Am. A 11, 2695–2703 (1994). [CrossRef]
  6. L. Escoubas, F. Flory, F. Lemarchand, A. During, L. Roux, “Enhanced diffraction efficiency of gratings in multilayer,” Opt. Lett. 25, 194–196 (2000). [CrossRef]
  7. W. Southwell, “Pyramid-array surface-relief structures producing antireflection index matching on optical surfaces,” J. Opt. Soc. Am. A 8, 549–553 (1991). [CrossRef]
  8. S. Rytov, “Electromagnetic properties of finely stratified medium,” Sov. Phys. JETP 2, 466–474 (1956).
  9. P. Lalanne, D. Lemercier-Lalanne, “On the effective medium theory of subwavelength periodic structures,” J. Mod Opt 43, 2063–2085 (1996). [CrossRef]
  10. E. Pelletier, P. Roche, B. Vidal, “Determination automatique des constantes optiques et de l’épaisseur de couches minces: application aux couches diélectriques,” Nouv. Rev. Opt. 7, 353–362 (1976). [CrossRef]
  11. S. Tisserand, F. Flory, A. Gatto, L. Roux, M. Adamik, I. Kovacs, “Titanium implantation in bulk and thin film amorphous silica,” J. Appl. Phys 83, 5150–5153 (1998). [CrossRef]

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