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Applied Optics

Applied Optics


  • Vol. 41, Iss. 19 — Jul. 1, 2002
  • pp: 3840–3846

Preparation and characterization of a reference aluminum mirror

Tzwetanka Babeva, Snejana Kitova, Borislav Mednikarov, and Ivan Konstantinov  »View Author Affiliations

Applied Optics, Vol. 41, Issue 19, pp. 3840-3846 (2002)

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The preparation and characterization of a reference mirror of protected aluminum (Al) is reported. The mirror is made of 50–60-nm-thick Al film, coated with several-nanometer-thick Al2O3 and 30-nm-thick film of AlN. The mirror characterization is based on reliable and precise reflectance measurements relative to a silicon- (Si-) wafer reference mirror. The simple phenomenological Drude–Lorentz model is applied for modeling the dispersion relations n(λ) and k(λ) of the Al film. The reflection of the protected Al mirror is determined in the 400–800-nm spectral range with accuracy better than 0.01 for p- and s-polarized light at angles of incidence from 0° to 70°. The accuracy has been confirmed with an evaporated thin silver film with known n(λ), k(λ), and d derived by photometric measurements at normal light incidence.

© 2002 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.5700) Instrumentation, measurement, and metrology : Reflection
(230.4040) Optical devices : Mirrors
(230.4170) Optical devices : Multilayers
(260.3910) Physical optics : Metal optics

Original Manuscript: July 3, 2002
Revised Manuscript: January 3, 2002
Published: July 1, 2002

Tzwetanka Babeva, Snejana Kitova, Borislav Mednikarov, and Ivan Konstantinov, "Preparation and characterization of a reference aluminum mirror," Appl. Opt. 41, 3840-3846 (2002)

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