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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 19 — Jul. 1, 2002
  • pp: 3847–3852

Modeling the bidirectional reflectance of emissive displays

Aldo Badano  »View Author Affiliations


Applied Optics, Vol. 41, Issue 19, pp. 3847-3852 (2002)
http://dx.doi.org/10.1364/AO.41.003847


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Abstract

The reflection properties of a display device influence the available contrast and affect the perception of subtle detail. The display reflection characteristics of flat-panel displays (FPDs) are appropriately described by a six-dimensional bidirectional reflectance distribution function (BRDF). I describe a Monte Carlo method for modeling the bidirectional reflectance of multilayer emissive structures used in electronic display devices. I estimate the complete BRDF using a one-dimensional angular distribution function of the luminance. I apply the method to model typical high-performance cathode-ray tube and FPD structures. I find that, for the BRDF signatures of cathode-ray tubes characterized by a specular and a quasi-Lambertian components, the estimated values for the specular and diffuse reflection coefficients agree well with low-resolution experimental measurements conducted with a rotation arm and a collimated probe. I show that emissive FPDs with thin-film organic layers on reflective substrates can exhibit a predominant specular peak broadened by short-range light scattering.

© 2002 Optical Society of America

OCIS Codes
(120.2040) Instrumentation, measurement, and metrology : Displays
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5240) Instrumentation, measurement, and metrology : Photometry
(120.5700) Instrumentation, measurement, and metrology : Reflection
(250.1500) Optoelectronics : Cathodoluminescence
(250.3680) Optoelectronics : Light-emitting polymers

History
Original Manuscript: January 2, 2002
Revised Manuscript: March 7, 2002
Published: July 1, 2002

Citation
Aldo Badano, "Modeling the bidirectional reflectance of emissive displays," Appl. Opt. 41, 3847-3852 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-19-3847


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References

  1. A. Badano, “Image quality degradation by light scattering processes in high performance display devices for medical imaging,” Ph.D. dissertation (University of Michigan, Ann Arbor, Mich., 1999).
  2. M. E. Becker, “Evaluation and characterization of display reflectance,” Displays 19, 35–54 (1998). [CrossRef]
  3. E. F. Kelley, “Display reflectance model based on BRDF,” Displays 19, 27–34 (1998). [CrossRef]
  4. M. Elias, L. Simonot, M. Menu, “Bidirectional reflectance of a diffuse background covered by a partly absorbing layer,” Opt. Commun. 191, 1–7 (2001). [CrossRef]
  5. J. Delacour, S. Ungar, G. Mathieu, G. Hasna, P. Martinez, J.-C. Roche, “Front panel engineering with CAD simulation tool,” in Flat Panel Display Technology and Display Metrology, B. Gnade, E. F. Kelley, eds., Proc. SPIE3636, 11–21 (1999). [CrossRef]
  6. A. Badano, M. J. Flynn, E. Muka, K. Compton, T. Monsees, “Veiling glare point-spread function of medical imaging monitors,” in Medical Imaging 1999: Image Display, S. K. Mun, Y. Kim, eds., Proc. SPIE3658, 458–467 (1999). [CrossRef]
  7. M. Born, E. Wolf, Principles of Optics, 3rd ed. (Pergamon, New York, 1965).
  8. A. Badano, J. Kanicki, “Monte Carlo analysis of the spectral photon emission and extraction efficiency of organic light-emitting devices,” J. Appl. Phys. 90, 1827–1830 (2001). [CrossRef]
  9. This assumption is not true for emissive displays with polarizer films or for liquid-crystal displays. An extension of this research to include such structures is in progress.
  10. A. Badano, M. J. Flynn, “Method for measuring veiling glare in high-performance display devices,” Appl. Opt. 39, 2059–2066.

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