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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 19 — Jul. 1, 2002
  • pp: 3906–3910

Sinusoidal-Wavelength-Scanning Interferometer with Double Feedback Control for Real-Time Distance Measurement

Osami Sasaki, Kazuhiro Akiyama, and Takamasa Suzuki  »View Author Affiliations


Applied Optics, Vol. 41, Issue 19, pp. 3906-3910 (2002)
http://dx.doi.org/10.1364/AO.41.003906


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Abstract

In addition to a conventional phase α the interference signal of a sinusoidal-wavelength-scanning interferometer has a phase-modulation amplitude Zb that is proportional to the optical path difference L and amplitude b of the wavelength scan. L and b are controlled by a double feedback system so that the phase α and the amplitude Zb are kept at 3π/2 and π, respectively. The voltage applied to a device that displaces a reference mirror to change the optical path difference becomes a ruler with scales smaller than a wavelength. Voltage applied to a device that determines the amplitude of the wavelength scan becomes a ruler marking every wavelength. These two rulers enable one to measure an absolute distance longer than a wavelength in real time.

© 2002 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.5060) Instrumentation, measurement, and metrology : Phase modulation

Citation
Osami Sasaki, Kazuhiro Akiyama, and Takamasa Suzuki, "Sinusoidal-Wavelength-Scanning Interferometer with Double Feedback Control for Real-Time Distance Measurement," Appl. Opt. 41, 3906-3910 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-19-3906

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