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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 19 — Jul. 1, 2002
  • pp: 3950–3960

Magneto-optic ellipsometry in exchange-coupled films

Štefan Višňovský, Kamil Postava, Tomuo Yamaguchi, and Radek Lopušník  »View Author Affiliations


Applied Optics, Vol. 41, Issue 19, pp. 3950-3960 (2002)
http://dx.doi.org/10.1364/AO.41.003950


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Abstract

Analytical representations of Jones matrices for the magneto-optic (MO) reflection in (a) a magnetic film on a magnetic substrate separated by a nonmagnetic spacer and (b) two ultrathin magnetic films separated by a nonmagnetic spacer, sandwiched between a nonmagnetic cover and a nonmagnetic substrate with arbitrary and independent orientations of magnetization, are provided. Originally isotropic media subjected to a uniform magnetization are considered. The discussion of MO response is restricted to the terms linear in the off-diagonal permittivity tensor elements, and typical situations are illustrated numerically. The results are useful for the analysis of the experiments in MO ellipsometry and MO magnetometry of exchange-coupled magnetic ultrathin-film structures.

© 2002 Optical Society of America

OCIS Codes
(210.3810) Optical data storage : Magneto-optic systems
(240.0310) Optics at surfaces : Thin films
(260.2130) Physical optics : Ellipsometry and polarimetry

History
Original Manuscript: June 4, 2001
Revised Manuscript: January 3, 2002
Published: July 1, 2002

Citation
Štefan Višňovský, Kamil Postava, Tomuo Yamaguchi, and Radek Lopušník, "Magneto-optic ellipsometry in exchange-coupled films," Appl. Opt. 41, 3950-3960 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-19-3950


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