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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 2 — Jan. 10, 2002
  • pp: 312–319

Characterization of diffraction patterns directly from in-line holograms with the fractional Fourier transform

Sébastien Coëtmellec, Denis Lebrun, and Cafer Özkul  »View Author Affiliations


Applied Optics, Vol. 41, Issue 2, pp. 312-319 (2002)
http://dx.doi.org/10.1364/AO.41.000312


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Abstract

We show that the fractional Fourier transform is a suitable mechanism with which to analyze the diffraction patterns produced by a one-dimensional object because its intensity distribution is partially described by a linear chirp function. The three-dimensional location and the diameter of a fiber can be determined, provided that the optimal fractional order is selected. The effect of compaction of the intensity distribution in the fractional Fourier domain is discussed. A few experimental results are presented.

© 2002 Optical Society of America

OCIS Codes
(100.2000) Image processing : Digital image processing
(100.2650) Image processing : Fringe analysis
(100.3190) Image processing : Inverse problems

History
Original Manuscript: April 13, 2001
Revised Manuscript: September 10, 2001
Published: January 10, 2002

Citation
Sébastien Coëtmellec, Denis Lebrun, and Cafer Özkul, "Characterization of diffraction patterns directly from in-line holograms with the fractional Fourier transform," Appl. Opt. 41, 312-319 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-2-312

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