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Applied Optics

Applied Optics


  • Vol. 41, Iss. 2 — Jan. 10, 2002
  • pp: 361–369

Measurement of the thermal coefficients of rewritable phase-change optical recording media

Chubing Peng and Masud Mansuripur  »View Author Affiliations

Applied Optics, Vol. 41, Issue 2, pp. 361-369 (2002)

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We describe a method to estimate the heat capacity of the substrate, the dielectric layer, and the phase-change layer of phase-change optical recording media as well as the thermal conductivity of the phase-change layer in its crystalline state. Measurements were carried out on spinning disks with the beam of light focused and locked onto the groove track. The method relies on the identification of the solid-to-liquid phase transition that occurs in the phase-change layer and takes advantage of the dependence of thermal diffusion on track velocity and irradiation time.

© 2002 Optical Society of America

OCIS Codes
(210.0210) Optical data storage : Optical data storage
(210.4810) Optical data storage : Optical storage-recording materials

Original Manuscript: March 14, 2001
Revised Manuscript: September 26, 2001
Published: January 10, 2002

Chubing Peng and Masud Mansuripur, "Measurement of the thermal coefficients of rewritable phase-change optical recording media," Appl. Opt. 41, 361-369 (2002)

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  1. J. Feinleib, J. de Nuerville, S. C. Moss, S. R. Ovshinsky, “Rapid reversible light-induced crystallization of amorphous semiconductors,” Appl. Phys. Lett. 18, 254–257 (1971). [CrossRef]
  2. N. Yamada, E. Ohno, N. Akahira, K. Nishiuchi, K. Nagata, M. Takeo, “High speed overwritable phase change optical disk material,” Jpn. J. Appl. Phys. Suppl. 26-4, 61–66 (1987).
  3. T. Ohta, K. Inoue, M. Uchida, K. Yoshioka, T. Akiyama, S. Furukawa, K. Nagata, S. Nakamura, “Phase-change disk media having rapid cooling structure,” Jpn. J. Appl. Phys. Suppl. 28-3, 123–128 (1989).
  4. C. Peng, M. Mansuripur, “Measurement of the thermal conductivity of the erasable phase-change optical recording media,” Appl. Opt. 39, 2347–2352 (2000). [CrossRef]
  5. B. Tieke, M. Dekker, N. Pfeffer, R. van Woudenberg, G. F. Zhou, I. P. D. Ubbens, “High data-rate phase-change media for the digital video recording system,” in Joint International Symposium on Optical Memory and Optical Data Storage, 1999, S. Kubota, R. Katayama, D. G. Stinson, eds., Proc. SPIE3864, 200–202 (1999).
  6. I. Friedrich, V. Weidenhof, W. Njoroge, P. Franz, M. Wuttig, “Structural transformations of Ge2Sb2Te5 films studied by electrical resistance measurements,” J. Appl. Phys. 87, 4130–4134 (2000). [CrossRef]
  7. S. L. Lai, G. Ramanath, L. H. Allen, P. Infante, “Heat capacity measurements of Sn nanostructures using a thin film differential scanning calorimeter with 0.2 nJ sensitivity,” Appl. Phys. Lett. 70, 43–45 (1997). [CrossRef]
  8. D. DeVecchio, D. Russell, P. Taborek, “Measurement of thermal diffusivity of small, high conductivity sample using a phase sensitive technique,” Rev. Sci. Instrum. 66, 3601–3605 (1995). [CrossRef]
  9. S. W. Indermuehle, R. B. Peterson, “A phase-sensitive technique for the thermal characterization of dielectric thin films,” Trans. ASME 121, 528–536 (1999). [CrossRef]
  10. R. W. Powell, “Thermal conductivity determinations by thermal comparator methods,” in Thermal Conductivity, R. T. Tye, ed. (Academic, London, 1969), Part 2, pp. 275–338.
  11. C. H. Henager, W. T. Dawlewicz, “Thermal conductivities of thin, sputtered optical films,” Appl. Opt. 32, 91–101 (1993). [CrossRef] [PubMed]
  12. N. Tsutsumi, T. Kiyotsukuri, “Measurement of thermal diffusivity for polymer film by flash radiometry,” Appl. Phys. Lett. 52, 442–444 (1988). [CrossRef]
  13. Y. Agari, A. Veda, S. Nagai, “Measurement of thermal diffusivity and specific heat capacity of polymers by laser flash method,” J. Polym. Sci. Part B Polym. Phys. 33, 33–42 (1995). [CrossRef]
  14. E. Welsch, H. G. Walther, K. Friedrich, P. Eckhardt, “Separation of optical thin film and substrate absorption by means of photothermal surface deformation technique,” J. Appl. Phys. 67, 6575–6578 (1990). [CrossRef]
  15. Z. L. Wu, M. Thomsen, P. K. Kuo, Y. S. Lu, C. Stolz, M. Kozlowski, “Overview of photothermal characterization of optical thin film coatings,” in 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, H. E. Bennett, A. H. Guenther, M. R. Kozlowski, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE2714, 465–481 (1996). [CrossRef]
  16. R. Forster, E. Gmelin, “Thermal conductivity and diffusivity measurements in the sub-µm and sub-µs scale on centimeter area samples using a microthermocouple,” Rev. Sci. Instrum. 67, 4246–4255 (1996). [CrossRef]
  17. S. Govorkov, W. Ruderman, “A new method for measuring thermal conductivity of thin films,” Rev. Sci. Instrum. 68, 3828–3834 (1997). [CrossRef]
  18. C. A. Paddock, G. L. Eesley, “Transient thermoreflectance from thin metal films,” J. Appl. Phys. 60, 285–290 (1986). [CrossRef]
  19. W. S. Capinski, H. J. Maris, T. Ruf, M. Cardona, K. Ploog, D. S. Katzer, “Thermal-conductivity measurements of GaAs/AlAs superlattices using a picosecond optical pump-and-probe technique,” Phys. Rev. B 59, 8105–8113 (1999). [CrossRef]
  20. C. Peng, M. Mansuripur, “Thermal cross-track cross talk in phase-change optical disk data storage,” J. Appl. Phys. 88, 1214–1220 (2000). [CrossRef]
  21. M. Mansuripur, C. Peng, J. K. Erwin, W. Bletscher, S. G. Kim, S. K. Lee, R. E. Gerber, C. Bartlett, T. D. Goodman, L. Cheng, C. S. Chung, T. Kim, K. Bates, “Versatile polychromatic dynamic testbed for optical disks,” Appl. Opt. 36, 9296–9303 (1997). [CrossRef]
  22. C. Peng, M. Mansuripur, “Sources of noise in erasable optical disk data storage,” Appl. Opt. 37, 921–928 (1998). [CrossRef]
  23. M. Mansuripur, G. A. N. Connell, J. W. Goodman, “Laser-induced local heating of multilayers,” Appl. Opt. 21, 1106–1114 (1982). [CrossRef] [PubMed]
  24. E. K. Kim, S. I. Kwun, S. M. Lee, H. Seo, J. G. Yoon, “Thermal boundary resistance at Ge2Sb2Te5/ZnS:SiO2 interface,” Appl. Phys. Lett. 76, 3864–3866 (2000). [CrossRef]
  25. S. M. Lee, D. G. Cahill, “Heat transport in thin dielectric films,” J. Appl. Phys. 81, 2590–2595 (2000). [CrossRef]

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