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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 2 — Jan. 10, 2002
  • pp: 370–378

Optical characterization of multilayer stacks used as phase-change media of optical disk data storage

Rongguang Liang, Chubing Peng, Kenichi Nagata, Kelly Daly-Flynn, and Masud Mansuripur  »View Author Affiliations


Applied Optics, Vol. 41, Issue 2, pp. 370-378 (2002)
http://dx.doi.org/10.1364/AO.41.000370


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Abstract

We report results of measurements of the optical constants of the dielectric layer (ZnS-SiO2), reflecting layer (aluminum–chromium alloy), and phase-change layer (GeSbTe, AgInSbTe) used as the media of phase-change optical recording. The refractive index n and the absorption coefficient k of these materials vary to some extent with the film thickness and with the film deposition environment. We report the observed variations of optical constants among samples of differing structure and among samples fabricated in different laboratories.

© 2002 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(210.0210) Optical data storage : Optical data storage
(210.4770) Optical data storage : Optical recording
(210.4810) Optical data storage : Optical storage-recording materials
(260.2130) Physical optics : Ellipsometry and polarimetry

History
Original Manuscript: April 4, 2001
Revised Manuscript: September 7, 2001
Published: January 10, 2002

Citation
Rongguang Liang, Chubing Peng, Kenichi Nagata, Kelly Daly-Flynn, and Masud Mansuripur, "Optical characterization of multilayer stacks used as phase-change media of optical disk data storage," Appl. Opt. 41, 370-378 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-2-370

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