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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 22 — Aug. 1, 2002
  • pp: 4477–4483

Fourier transform interferometer alignment method

Kenneth A. Goldberg, Patrick Naulleau, and Jeffrey Bokor  »View Author Affiliations


Applied Optics, Vol. 41, Issue 22, pp. 4477-4483 (2002)
http://dx.doi.org/10.1364/AO.41.004477


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Abstract

A rapid and convenient method has been developed to facilitate the alignment of the image-plane components of point-diffraction interferometers, including the phase-shifting point-diffraction interferometer. In real time, the Fourier transform of the detected image is used to calculate a pseudoimage of the electric field in the image plane of the test optic where the critical alignment of various optical components is performed. Reconstruction of the pseudoimage is similar to off-axis, Fourier transform holography. Intermediate steps in the alignment procedure are described. Fine alignment is aided by the introduction and optimization of a global-contrast parameter that is easily calculated from the Fourier transform. Additional applications include the alignment of image-plane apertures in general optical systems, the rapid identification of patterned image-plane alignment marks, and the probing of important image-plane field properties.

© 2002 Optical Society of America

OCIS Codes
(070.2580) Fourier optics and signal processing : Paraxial wave optics
(090.1760) Holography : Computer holography
(120.2880) Instrumentation, measurement, and metrology : Holographic interferometry
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(220.4840) Optical design and fabrication : Testing

History
Original Manuscript: October 10, 2001
Revised Manuscript: April 8, 2002
Published: August 1, 2002

Citation
Kenneth A. Goldberg, Patrick Naulleau, and Jeffrey Bokor, "Fourier transform interferometer alignment method," Appl. Opt. 41, 4477-4483 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-22-4477

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