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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 22 — Aug. 1, 2002
  • pp: 4536–4540

High-Precision System for Automatic Null Ellipsometric Measurement

Henian Zhu, Liguo Liu, Yiwu Wen, Zhengde Lü, and Baizhe Zhang  »View Author Affiliations


Applied Optics, Vol. 41, Issue 22, pp. 4536-4540 (2002)
http://dx.doi.org/10.1364/AO.41.004536


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Abstract

A system for automatic null ellipsometric measurement, which uses a new kind of achromatic rhomb-type λ/4 retarder, is designed and constructed. By use of terbium glass as the modulator’s material, a magneto-optical modulator and its driving circuit are constructed. The polarized light is modulated by dc and ac. Combined with an ultra-low noise frequency-selective amplifier and a lock-in amplifier, the null time of the mechanical and photoelectric automatic null system can be less than 15 s. After the error of the mechanical parts is excluded, the repeatability standard deviation S4 of nulling angles can be less than 0.00025 deg.

© 2002 Optical Society of America

[Optical Society of America ]

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(230.3810) Optical devices : Magneto-optic systems

Citation
Henian Zhu, Liguo Liu, Yiwu Wen, Zhengde Lü, and Baizhe Zhang, "High-Precision System for Automatic Null Ellipsometric Measurement," Appl. Opt. 41, 4536-4540 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-22-4536

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