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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 22 — Aug. 1, 2002
  • pp: 4548–4551

Spatial Fourier spectroscopy of guided modes in low-dimensional structures

Alexander V. Khomchenko  »View Author Affiliations


Applied Optics, Vol. 41, Issue 22, pp. 4548-4551 (2002)
http://dx.doi.org/10.1364/AO.41.004548


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Abstract

A new methodology for the study of low-dimensional thin-film structures and a new technique to determine nanolayer thickness are considered. These are based on recording and processing the changes in an angular Fourier spectrum of a light beam reflected from a prism coupler to excite the guided mode in a thin-film structure when the incident light beam intensity is increased.

© 2002 Optical Society of America

OCIS Codes
(130.4310) Integrated optics : Nonlinear
(190.1900) Nonlinear optics : Diagnostic applications of nonlinear optics
(190.4350) Nonlinear optics : Nonlinear optics at surfaces
(190.4390) Nonlinear optics : Nonlinear optics, integrated optics

History
Original Manuscript: December 4, 2001
Published: August 1, 2002

Citation
Alexander V. Khomchenko, "Spatial Fourier spectroscopy of guided modes in low-dimensional structures," Appl. Opt. 41, 4548-4551 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-22-4548


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References

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  11. A. V. Khomchenko, “m-lines technique application for studying of optical nonlinearities in thin films at a low light intensity,” Opt. Commun. 201(4–6), 363–372 (2002). [CrossRef]

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