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Applied Optics

Applied Optics


  • Vol. 41, Iss. 22 — Aug. 1, 2002
  • pp: 4548–4551

Spatial Fourier spectroscopy of guided modes in low-dimensional structures

Alexander V. Khomchenko  »View Author Affiliations

Applied Optics, Vol. 41, Issue 22, pp. 4548-4551 (2002)

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A new methodology for the study of low-dimensional thin-film structures and a new technique to determine nanolayer thickness are considered. These are based on recording and processing the changes in an angular Fourier spectrum of a light beam reflected from a prism coupler to excite the guided mode in a thin-film structure when the incident light beam intensity is increased.

© 2002 Optical Society of America

OCIS Codes
(130.4310) Integrated optics : Nonlinear
(190.1900) Nonlinear optics : Diagnostic applications of nonlinear optics
(190.4350) Nonlinear optics : Nonlinear optics at surfaces
(190.4390) Nonlinear optics : Nonlinear optics, integrated optics

Original Manuscript: December 4, 2001
Published: August 1, 2002

Alexander V. Khomchenko, "Spatial Fourier spectroscopy of guided modes in low-dimensional structures," Appl. Opt. 41, 4548-4551 (2002)

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