A new methodology for the study of low-dimensional thin-film structures and a new technique to determine nanolayer thickness are considered. These are based on recording and processing the changes in an angular Fourier spectrum of a light beam reflected from a prism coupler to excite the guided mode in a thin-film structure when the incident light beam intensity is increased.
© 2002 Optical Society of America
(130.4310) Integrated optics : Nonlinear
(190.1900) Nonlinear optics : Diagnostic applications of nonlinear optics
(190.4350) Nonlinear optics : Nonlinear optics at surfaces
(190.4390) Nonlinear optics : Nonlinear optics, integrated optics
Alexander V. Khomchenko, "Spatial Fourier Spectroscopy of Guided Modes in Low-Dimensional Structures," Appl. Opt. 41, 4548-4551 (2002)