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Applied Optics

Applied Optics


  • Vol. 41, Iss. 22 — Aug. 1, 2002
  • pp: 4620–4629

Fractal description of rough surfaces

Oleg V. Angelsky, Dmitry N. Burkovets, Alexander V. Kovalchuk, and Steen G. Hanson  »View Author Affiliations

Applied Optics, Vol. 41, Issue 22, pp. 4620-4629 (2002)

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The multifractal description of rough surfaces is discussed and the mechanisms for generation of fractal and multifractal height distributions of inhomogeneities for rough surfaces are simulated. The original technique for estimating the spectrum of singularities is proposed for the study of these distributions.

© 2002 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(170.6960) Medical optics and biotechnology : Tomography
(180.1790) Microscopy : Confocal microscopy
(240.5770) Optics at surfaces : Roughness
(290.0290) Scattering : Scattering

Original Manuscript: November 12, 2001
Revised Manuscript: March 14, 2002
Published: August 1, 2002

Oleg V. Angelsky, Dmitry N. Burkovets, Alexander V. Kovalchuk, and Steen G. Hanson, "Fractal description of rough surfaces," Appl. Opt. 41, 4620-4629 (2002)

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