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Applied Optics

Applied Optics


  • Vol. 41, Iss. 22 — Aug. 1, 2002
  • pp: 4655–4665

Highly efficient and aberration-corrected spectrometer for advanced Raman spectroscopy

Masayuki Futamata, Takehiko Takenouchi, and Kei-ichi Katakura  »View Author Affiliations

Applied Optics, Vol. 41, Issue 22, pp. 4655-4665 (2002)

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We designed an asymmetric Czerny-Turner-type spectrometer with a spectral resolution of approximately 1 cm-1 and a focal length of 500 mm (F/4.1) to improve the aberration properties: (1) coma aberration was corrected by use of a particular incident angle for a condensing mirror based on Shafer’s equation, (2) astigmatism was corrected by use of a toroidal condensing mirror, (3) the optimum distance was found between a grating and condensing mirror so that the centered light and marginal light at the detector possess the same incident angles to the condensing mirror (the aberration is therefore excellently corrected over the whole detector surfaces), and (4) these optimal configurations are ensured in a wide wavelength between 400 and 800 nm by use of gratings with different grooves. Then the spectrometer was constructed, and the excellent optical properties were confirmed with aligned fiber images and Raman spectra from copper phthalocyanine.

© 2002 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4140) Instrumentation, measurement, and metrology : Monochromators
(300.0300) Spectroscopy : Spectroscopy
(300.6190) Spectroscopy : Spectrometers
(300.6450) Spectroscopy : Spectroscopy, Raman

Original Manuscript: January 22, 2002
Revised Manuscript: April 8, 2002
Published: August 1, 2002

Masayuki Futamata, Takehiko Takenouchi, and Kei-ichi Katakura, "Highly efficient and aberration-corrected spectrometer for advanced Raman spectroscopy," Appl. Opt. 41, 4655-4665 (2002)

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  21. Rather excellent aberration properties were observed even at 550 nm with the 1200 grooves/mm grating; however, the spectral resolution with the slit width of 50 mm grows to approximately 3 cm-1. Moreover, poor aberration was obtained at 400 nm owing to the deviation from the optimum configuration.

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