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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 24 — Aug. 20, 2002
  • pp: 4996–5001

Surface Displacement Imaging by Interferometry with a Light Emitting Diode

Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Luis David Patino Lopez, Jean-Michel Rampnoux, and Wilfrid Claeys  »View Author Affiliations


Applied Optics, Vol. 41, Issue 24, pp. 4996-5001 (2002)
http://dx.doi.org/10.1364/AO.41.004996


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Abstract

We present an imaging technique to measure static surface displacements of electronic components. A device is supplied by a transient current that creates a variation of temperature, thus a surface displacement. To measure the latter, a setup that is based on a Michelson interferometer is used. To avoid the phenomenon of speckle and the drawbacks inherent to it, we use a light emitting diode as the light source for the interferometer. The detector is a visible CCD camera that analyzes the optical signal containing the information of surface displacement of the device. Combining images, we extract the amplitude of the surface displacement. Out-of-plane surface-displacement images of a thermoelectric device are presented.

© 2002 Optical Society of America

OCIS Codes
(000.2190) General : Experimental physics
(110.6820) Imaging systems : Thermal imaging
(120.6810) Instrumentation, measurement, and metrology : Thermal effects
(260.3160) Physical optics : Interference

Citation
Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Luis David Patino Lopez, Jean-Michel Rampnoux, and Wilfrid Claeys, "Surface Displacement Imaging by Interferometry with a Light Emitting Diode," Appl. Opt. 41, 4996-5001 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-24-4996

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