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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 24 — Aug. 20, 2002
  • pp: 5142–5147

Variable Pressure Infrared Diode Laser Spectroscopy: A New Method for Trace-Gas Monitoring

Sébastien Dusanter, Bernard Lemoine, Benjamin Hanoune, and Pascal Devolder  »View Author Affiliations


Applied Optics, Vol. 41, Issue 24, pp. 5142-5147 (2002)
http://dx.doi.org/10.1364/AO.41.005142


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Abstract

A new method for measuring trace concentrations of atmospheric pollutants by infrared diode laser spectroscopy has been devised. This method relies on the increase of the signal as the pressure inside the cell increases, while the frequency of the diode is stabilized on the line, even if it is unresolved. Performances of this method were tested with N<sub>2</sub>O and with 1, 3-butadiene. As an example of application, we measured the butadiene emitted by car exhausts. Sensitivity and rapidity of this method are equivalent to the usual scanning method in which the whole line is described, but this new method benefits from its simplicity and robustness.

© 2002 Optical Society of America

OCIS Codes
(010.1120) Atmospheric and oceanic optics : Air pollution monitoring
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.1030) Spectroscopy : Absorption
(300.6260) Spectroscopy : Spectroscopy, diode lasers
(300.6340) Spectroscopy : Spectroscopy, infrared

Citation
Sébastien Dusanter, Bernard Lemoine, Benjamin Hanoune, and Pascal Devolder, "Variable Pressure Infrared Diode Laser Spectroscopy: A New Method for Trace-Gas Monitoring," Appl. Opt. 41, 5142-5147 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-24-5142

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