To demonstrate the potential of the cavity ringdown technique in mid-infrared spectroscopy of thin film samples, we measured absorption losses in a C60 film on a BaF2 substrate using a tunable optical parametric amplifier source. With a Brewster angle sample geometry, we achieved a fractional loss sensitivity as small as 1.3 × 10-7 with 1.5 cm-1 resolution, an improvement in sensitivity of 2 orders of magnitude compared to standard Fourier transform infrared methods. At an absorption sensitivity of 5 × 10-7, spectra of several C60 overtone lines were recorded.
© 2002 Optical Society of America
Original Manuscript: January 21, 2002
Revised Manuscript: June 7, 2002
Published: August 20, 2002
George A. Marcus and H. Alan Schwettman, "Cavity ringdown spectroscopy of thin films in the mid-infrared," Appl. Opt. 41, 5167-5171 (2002)