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Applied Optics

Applied Optics


  • Vol. 41, Iss. 25 — Sep. 1, 2002
  • pp: 5209–5217

X-ray absolute calibration of the time response of a silicon photodiode

John F. Seely, Craig N. Boyer, Glenn E. Holland, and James L. Weaver  »View Author Affiliations

Applied Optics, Vol. 41, Issue 25, pp. 5209-5217 (2002)

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The time-dependent response of a 1-mm2 silicon photodiode was characterized by use of pulsed synchrotron radiation in the 4- to 16-nm-wavelength range. Modeling the input radiation pulse and the electrical response of the photodiode allowed the photodiode’s capacitance as a function of wavelength and applied bias voltage to be determined. The capacitance was in the 7- to 19-pF range and resulted in response fall times as small as 0.4 ns. The capacitance determined by pulsed x-ray illumination was in good agreement with the capacitance determined by pulsed optical laser illumination. The absolute responsivity was measured by comparison with the responsivity of a calibrated photodiode.

© 2002 Optical Society of America

OCIS Codes
(040.5160) Detectors : Photodetectors
(040.6040) Detectors : Silicon
(040.7480) Detectors : X-rays, soft x-rays, extreme ultraviolet (EUV)
(230.5170) Optical devices : Photodiodes

Original Manuscript: January 3, 2002
Revised Manuscript: May 15, 2002
Published: September 1, 2002

John F. Seely, Craig N. Boyer, Glenn E. Holland, and James L. Weaver, "X-ray absolute calibration of the time response of a silicon photodiode," Appl. Opt. 41, 5209-5217 (2002)

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