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Applied Optics

Applied Optics


  • Vol. 41, Iss. 25 — Sep. 1, 2002
  • pp: 5290–5297

Colorimetry-based retardation measurement method with white-light interference

Carole C. Montarou, Thomas K. Gaylord, Ricardo A. Villalaz, and Elias N. Glytsis  »View Author Affiliations

Applied Optics, Vol. 41, Issue 25, pp. 5290-5297 (2002)

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A colorimetry-based retardation measurement (CBRM) method is presented. The specimen, between crossed polarizers, is illuminated with a white-light source. The retardation that is due to the birefringence of the specimen produces a white-light interference color. The x, y chromaticity coordinates of the color produced are measured with a spectrophotometer. The resulting x, y values are compared with a retardation x, y database that we obtained by measuring the retardation with an accurate Senarmont compensator and the x, y chromaticity values along the length of a 0–4-order quartz wedge. The technique was validated by the measurement of a variety of retardation plates. The retardation accuracy (mean error) of the CBRM method is shown to be 3.6 nm. The resolution is ±0.2 nm, and the measurement range is 5–2150 nm. The method substitutes for a polariscope and eliminates errors associated with quarter-wave plates. The CBRM method does not utilize any moving parts and thus is fast and can be automated.

© 2002 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(180.0180) Microscopy : Microscopy
(330.0330) Vision, color, and visual optics : Vision, color, and visual optics

Original Manuscript: February 8, 2002
Revised Manuscript: May 16, 2002
Published: September 1, 2002

Carole C. Montarou, Thomas K. Gaylord, Ricardo A. Villalaz, and Elias N. Glytsis, "Colorimetry-based retardation measurement method with white-light interference," Appl. Opt. 41, 5290-5297 (2002)

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