OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 25 — Sep. 1, 2002
  • pp: 5290–5297

Colorimetry-based retardation measurement method with white-light interference

Carole C. Montarou, Thomas K. Gaylord, Ricardo A. Villalaz, and Elias N. Glytsis  »View Author Affiliations


Applied Optics, Vol. 41, Issue 25, pp. 5290-5297 (2002)
http://dx.doi.org/10.1364/AO.41.005290


View Full Text Article

Enhanced HTML    Acrobat PDF (862 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

A colorimetry-based retardation measurement (CBRM) method is presented. The specimen, between crossed polarizers, is illuminated with a white-light source. The retardation that is due to the birefringence of the specimen produces a white-light interference color. The x, y chromaticity coordinates of the color produced are measured with a spectrophotometer. The resulting x, y values are compared with a retardation x, y database that we obtained by measuring the retardation with an accurate Senarmont compensator and the x, y chromaticity values along the length of a 0–4-order quartz wedge. The technique was validated by the measurement of a variety of retardation plates. The retardation accuracy (mean error) of the CBRM method is shown to be 3.6 nm. The resolution is ±0.2 nm, and the measurement range is 5–2150 nm. The method substitutes for a polariscope and eliminates errors associated with quarter-wave plates. The CBRM method does not utilize any moving parts and thus is fast and can be automated.

© 2002 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(180.0180) Microscopy : Microscopy
(330.0330) Vision, color, and visual optics : Vision, color, and visual optics

History
Original Manuscript: February 8, 2002
Revised Manuscript: May 16, 2002
Published: September 1, 2002

Citation
Carole C. Montarou, Thomas K. Gaylord, Ricardo A. Villalaz, and Elias N. Glytsis, "Colorimetry-based retardation measurement method with white-light interference," Appl. Opt. 41, 5290-5297 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-25-5290


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. A. Redner, “Photoelastic measurements by means of computer-assisted spectral-contents analysis,” Exp. Mech. 25, 148–153 (1985). [CrossRef]
  2. A. Redner, “Photoelastic measurements of residual stresses for NDE,” in International Conference on Photomechanics and Speckle Metrology, F.-P. Chiang, ed., Proc. SPIE814, 16–19 (1987). [CrossRef]
  3. Y. Park, T. J. Ahn, Y. H. Kim, W. T. Han, U. C. Paek, D. Y. Kim, “Measurement method for profiling the residual stress and the strain-optic coefficient of an optical fiber,” Appl. Opt. 41, 21–26 (2000). [CrossRef]
  4. P. L. Chu, T. Whitbread, “Measurement of stresses in optical fiber and preform,” Appl. Opt. 21, 4241–4245 (1982). [CrossRef] [PubMed]
  5. J. M. Desse, “Three-color differential interferometry,” Appl. Opt. 36, 7150–7156 (1997). [CrossRef]
  6. A. Ajovalasit, S. Baronne, G. Petrucci, “A method for reducing the influence of quarter-wave plate errors in phase-stepping photoelasticity,” J. Strain Anal. 33, 207–216 (1998). [CrossRef]
  7. A. Ajovalasit, S. Baronne, G. Petrucci, “A review of automated methods for the collection and analysis of photoelastic data,” J. Strain Anal. 33, 75–91 (1998). [CrossRef]
  8. A. Ajovalasit, S. Baronne, G. Petrucci, “Automated photoelasticity in white light: influences of quarter-wave plates,” J. Strain Anal. 30, 29–34 (1995). [CrossRef]
  9. A. Ajovalasit, S. Baronne, G. Petrucci, “Towards RGB photoelasticity: full-field automated photoelasticity in white light,” Exp. Mech. 35, 193–200 (1995). [CrossRef]
  10. G. Petrucci, “Full-field automated evaluation of an isoclinic parameter in white light,” Exp. Mech. 37, 420–426 (1997). [CrossRef]
  11. A. Berger-Schunn, Practical Color Measurement (Wiley, New York, 1994).
  12. F. D. Bloss, An Introduction to the Methods of Optical Crystallography (Holt, Philadelphia, Pa., 1961).
  13. N. H. Hartshorne, A. Stuart, Crystals and the Polarizing Microscope (Edward Arnold, London, 1960).
  14. N. G. Theofanous, A. T. Arapoyianni, “Effect of multiple reflections on retardation-based electro-optic measurements,” J. Opt. Soc. Am. A 8, 1746–1754 (1991). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited